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pro vyhledávání: '"Choon Hyeong Jo"'
Autor:
Sungwoo Jun, Hyunjun Choi, Dae Hwan Kim, Woojoon Kim, Inseok Hur, Euiyeon Hong, Jaewook Lee, Choon Hyeong Jo, Yun Hyeok Kim, Seonwook Hwang, Dong Myong Kim, Hagyoul Bae, Hyojoon Seo, Daeyoun Yun, Hyun Kwang Jeong
Publikováno v:
IEEE Electron Device Letters. 33:1138-1140
We propose a modified conductance method for extraction of the subgap density of states (DOS) in amorphous indium-gallium-zinc oxide thin-film transistors by using the measured capacitance and conductance through the capacitance-voltage (C-V) measure