Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Chong, Minsu"'
Autor:
Kim, Hyuk Jin, Chong, Minsu, Rhee, Tae Gyu, Khim, Yeong Gwang, Jung, Min-Hyoung, Kim, Young-Min, Jeong, Hu Young, Choi, Byoung Ki, Chang, Young Jun
Publikováno v:
Nano Convergence 10, 10 (2023)
In situ reflective high-energy electron diffraction (RHEED) is widely used to monitor the surface crystalline state during thin-film growth by molecular beam epitaxy (MBE) and pulsed laser deposition. With the recent development of machine learning (
Externí odkaz:
http://arxiv.org/abs/2310.14205
Autor:
Chong, Minsu, Rhee, Tae Gyu, Khim, Yeong Gwang, Jung, Min-Hyoung, Kim, Young-Min, Jeong, Hu Young, Kim, Heung-Sik, Chang, Young Jun, Kim, Hyuk Jin
Publikováno v:
In Applied Surface Science 1 October 2024 669
Autor:
Kim, Hyuk Jin, Chong, Minsu, Rhee, Tae Gyu, Khim, Yeong Gwang, Jung, Min-Hyoung, Kim, Young-Min, Jeong, Hu Young, Choi, Byoung Ki, Chang, Young Jun
Additional file 1: Figure S1. XPS spectra of 3UC ReSe2 thin film. (a) Wide scan, and narrow scans in (b) Re 4f, and (c) Se 3d peak. Atomic ratio of Se/Re is about 2.01. Figure S2. Fraction variance of six principal components of PCA in 3UC ReSe2. Fig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::58b12204605dfca475817bcd8bedd075
Publikováno v:
IEEE Communications Letters; Dec2005, Vol. 9 Issue 12, p1084-1120, 37p
Publikováno v:
IEEE Communications Letters; Oct2005, Vol. 9 Issue 10, p957-959, 3p
Publikováno v:
IEEE Communications Letters; Oct2005, Vol. 9 Issue 10, p01-04-04, 1p