Zobrazeno 1 - 10
of 151
pro vyhledávání: '"Choi, U.M."'
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability November 2020 114
Publikováno v:
In Microelectronics Reliability September 2019 100-101
Publikováno v:
In Microelectronics Reliability September 2018 88-90:788-794
Publikováno v:
In Microelectronics Reliability September 2017 76-77:522-526
Autor:
Choi, U.M., Blaabjerg, F., Jørgensen, S., Iannuzzo, F., Wang, H., Uhrenfeldt, C., Munk-Nielsen, S.
Publikováno v:
In Microelectronics Reliability September 2016 64:403-408
Publikováno v:
In Microelectronics Reliability August-September 2015 55(9-10):2022-2026
Autor:
Zhang, Yifei1 (AUTHOR) elyzha@leeds.ac.uk, Li, Kang1 (AUTHOR) k.li1@leeds.ac.uk, Zhang, Li1 (AUTHOR)
Publikováno v:
Energies (19961073). Aug2024, Vol. 17 Issue 15, p3655. 17p.
Autor:
Huang, Tianqi1 (AUTHOR) tianqih@ncepu.edu.cn, Singh, Bhanu Pratap2 (AUTHOR) tianqih@ncepu.edu.cn, Liu, Yongqian1 (AUTHOR), Norrga, Staffan2 (AUTHOR)
Publikováno v:
Energies (19961073). Jun2024, Vol. 17 Issue 11, p2557. 22p.
Autor:
Lee, Hyunjae1 (AUTHOR) lhj501@gachon.ac.kr, Kim, Gildong2 (AUTHOR), Shon, Jingeun1 (AUTHOR) shon@gachon.ac.kr
Publikováno v:
Energies (19961073). Apr2024, Vol. 17 Issue 8, p1967. 17p.