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pro vyhledávání: '"Chiu-Mei Shueh"'
Autor:
Chiu-Mei Shueh, 薛秋美
94
The concentration of Cd and Te in the interface of CdTe/InSb is measured by X-ray three-beam diffraction (002/-3-11) under resonant conditions. Because of anomalous scattering effects, phase shift due to resonance becomes much more appreciabl
The concentration of Cd and Te in the interface of CdTe/InSb is measured by X-ray three-beam diffraction (002/-3-11) under resonant conditions. Because of anomalous scattering effects, phase shift due to resonance becomes much more appreciabl
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/94868039010663161927
Autor:
Chiu-Mei, Shueh
Thesis (M.A.)--National Tsing Hua University Physics
Non-Latin script record. Includes bibliographical references
Non-Latin script record. Includes bibliographical references