Zobrazeno 1 - 10
of 50
pro vyhledávání: '"Ching-Kuan Lee"'
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 21:96-101
In recent years, the use of fan-out packaging solutions has boomed in semiconductor-related fields. There are primarily two versions used for mass production: wafer level and panel level. In this research, a glass substrate was used in the design of
Publikováno v:
Transactions of The Japan Institute of Electronics Packaging. 9:E16-009
Publikováno v:
2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC).
In this paper, we investigate antenna on glass and compare the property with antenna on ceramic substrate at 60GHz band for Wireless Gigabit alliance application. The design of Antenna on Corning EAGLE XG Glass is dependent on the result of simulatio
Autor:
Yu-Mei Cheng, Ren-Shing Cheng, Li-Ling Liao, Jui-Feng Hung, Yu-Lin Chao, Ra-Min Tain, Ming-Ji Dai, Yu-Wei Huang, Heng-Chieh Chien, Chun-Hsien Chien, Wei-Chung Lo, Chau-Jie Zhan, Ching-Kuan Lee, Ming-Jer Kao, Sheng-Tsai Wu, John H. Lau
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 4:1407-1419
In this investigation, a system-in-package (SiP) that consists of a very low-cost interposer with through-silicon holes (TSHs) and with chips on its top and bottom sides (a real 3-D IC integration) is studied. Emphasis is placed on the fabrication of
Publikováno v:
Journal of the Chinese Chemical Society. 60:745-754
The synthesis and characterization for a series of symmetrical 1,3-dialkylimidazolium salts with different chain lengths and counter anions together with their 1-alkylimidazole precursors are described. Liquid crystal (LC) properties of these salts a
Autor:
Kuo-Chyuan Chen, Hsiang-Hung Chang, Yuan-Chang Lee, Ching-Kuan Lee, Yung Jean Rachel Lu, Jen-Chun Wang, Chia-Wen Fan, Wen-Wei Shen, Huan-Chun Fu, Chau-Jie Zhan
Publikováno v:
2016 11th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
In this paper, we investigate reliability testing for a glass interposer. The test vehicle is an assembled glass interposer with a chip, a BT substrate. The structure of a glass interposer with two redistribution layers (RDLs) on the front-side and o
Autor:
Yu-Min Lin, Chia-Wen Fan, Chau-Jie Zhan, Wen-Wei Shen, Huan-Chun Fu, Su-Ching Chung, Su-Mei Chen, Chia-Wen Chiang, Jen-Chun Wang, Wei-Chung Lo, Hsiang-Hung Chang, Yuan-Chang Lee, Ching-Kuan Lee, Yung Jean Lu
Publikováno v:
2016 International Conference on Electronics Packaging (ICEP).
In this paper, we investigated the reliability test for Glass interposer. The test vehicle is assembled glass interposer with chip, BT substrate, and PCB. The structure of a glass interposer with two RDL on the front-side and one RDL on the backside
Autor:
Yu-Lan Lu, Jui-Hsiung Huang, Ming-Jer Kao, Cheng-Ta Ko, Huan-Chun Fu, Ching-Kuan Lee, Robert Lo, Ren-Shin Cheng, Zhi-Cheng Hsiao, Kuo-Shu Kao, John H. Lau, Pei-Chen Chang, Yu-Jiau Huang, Tao-Chih Chang
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 2:1229-1238
In this investigation, Cu-Sn lead-free solder microbumps on 10-μm pads with a 20-μm pitch are designed and fabricated. The chip size is 5 × 5 mm with thousands of microbumps. A daisy-chain feature is adopted for the characterization and reliabilit
Autor:
Jui-Chin Chen, Shang-Chun Chen, Peng Su, Chien-Ying Wu, Li Li, Pei-Jer Tzeng, M. Brillhart, Jie Xue, Yu-Chen Hsin, Ming-Ji Dai, Ching-Kuan Lee, John H. Lau, Chau-Jie Zhan
Publikováno v:
International Symposium on Microelectronics. 2012:001209-001214
The feasibility study of a 3D IC integration SiP is demonstrated in this investigation. The heart of this SiP is a TSV (through-silicon via) passive interposer (28mm × 28mm) with double sided wiring layers. This interposer is used to support a very
Autor:
Su-Mei Chen, Yu-Min Lin, Huan-Chun Fu, Yung Jean Lu, Chia-Wen Fan, Jen-Chun Wang, C. W. Chiang, Wei-Chung Lo, Yuan-Chang Lee, Ching-Kuan Lee, Chau-Jie Zhan, Wen-Wei Shen, Su-Ching Chung
Publikováno v:
2015 10th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
In this paper, we investigated the assembly characterization for reliability test. The structure of a glass interposer with two RDL on the front-side and one RDL on the backside had been evaluated and developed. Key technologies, including via fabric