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pro vyhledávání: '"Ching‐Kun Lin"'
Autor:
Ching-Kun Lin, 林慶焜
95
Face the process yield rate improvements of motherboard, although general enterprises finish deploy goal to each functions by overall quality managements, through quality improvement methods, industry engineering methods, PDCA methods and oth
Face the process yield rate improvements of motherboard, although general enterprises finish deploy goal to each functions by overall quality managements, through quality improvement methods, industry engineering methods, PDCA methods and oth
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/66070928089169981255
Publikováno v:
Asian Journal on Quality. 10:1-23
Face the process yield rate improvements of motherboard, although general enterprises finish deployment goal of each functions by overall quality managements, through quality improvement methods, industry engineering methods, plan‐do‐check‐act
Publikováno v:
Singapore International Conference on Intelligent Control and Instrumentation [Proceedings 1992].
Publikováno v:
Singapore International Conference on Intelligent Control & Instrumentation Proceedings 1992; 1992, Issue 1, p220-225, 6p