Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Chin-Hung Kuo"'
Publikováno v:
IEEE Access, Vol 7, Pp 56198-56207 (2019)
In a smart factory, thousands of industrial Internet of Things (IIoT) devices or sensors are installed in production machines to collect big data on machine conditions and transmit it to a cyber-physical system in the cloud center of the factory. The
Externí odkaz:
https://doaj.org/article/4b11247674554c42b78476ebb703a153
Publikováno v:
IEEE Access, Vol 7, Pp 56198-56207 (2019)
In a smart factory, thousands of industrial Internet of Things (IIoT) devices or sensors are installed in production machines to collect big data on machine conditions and transmit it to a cyber-physical system in the cloud center of the factory. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5c16d7a9b6858da1687f5f96c214a13
https://ieeexplore.ieee.org/document/8694986/
https://ieeexplore.ieee.org/document/8694986/
Publikováno v:
2018 IEEE International Conference on Advanced Manufacturing (ICAM).
Taiwan's high-temperature hot spring area often use the diversification, such as: bathing, cooking, agricultural irrigation. The development of products can reduce the use of gas, electricity and other fuel use, also reduce the generation of carbon e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d7ef28648b256e31a6f3192d529c876
https://doi.org/10.1109/amcon.2018.8614900
https://doi.org/10.1109/amcon.2018.8614900
Publikováno v:
Microelectronics Reliability. 53:2012-2017
The effects of minor Ni addition (0.05 wt.%) on the microstructures and mechanical reliability of the lead-free solder joints used in the pin through hole (PTH) components were carefully investigated using a scanning electron microscope (SEM), a fiel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e707cb456b527cd009176dba98b38c4
https://doi.org/10.1016/j.microrel.2013.03.002
https://doi.org/10.1016/j.microrel.2013.03.002
Autor:
Sharief, Farhana1 (AUTHOR) farhana.shareef@uos.edu.pk, Ijaz, Humaira2 (AUTHOR) humaira.bilalrasul@uos.edu.pk, Shojafar, Mohammad3 (AUTHOR) m.shojafar@surrey.ac.uk, Naeem, Muhammad Asif4 (AUTHOR) asif.naeem@nu.edu.pk
Publikováno v:
ACM Computing Surveys. Jan2025, Vol. 57 Issue 1, p1-48. 48p.