Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Chin-Chia Kuo"'
Autor:
Seiji Takahashi, Yi-Min Huang, Jhy-Jyi Sze, Tung-Ting Wu, Fu-Sheng Guo, Wei-Cheng Hsu, Tung-Hsiung Tseng, King Liao, Chin-Chia Kuo, Tzu-Hsiang Chen, Wei-Chieh Chiang, Chun-Hao Chuang, Keng-Yu Chou, Chi-Hsien Chung, Kuo-Yu Chou, Chien-Hsien Tseng, Chuan-Joung Wang, Dun-Nien Yaung
Publikováno v:
Sensors, Vol 17, Iss 12, p 2816 (2017)
A submicron pixel’s light and dark performance were studied by experiment and simulation. An advanced node technology incorporated with a stacked CMOS image sensor (CIS) is promising in that it may enhance performance. In this work, we demonstrated
Externí odkaz:
https://doaj.org/article/e943c9552b8649ad8783b651839b2c7f
Autor:
Chin-Chia Kuo, 郭晉嘉
100
This thises was prepared the nano material structure used in flexible DSSCs, the most important addition to the advantages of the process of DSSCs cheaper and simpler to how to improve the flexible substrate to make the efficiency of the cel
This thises was prepared the nano material structure used in flexible DSSCs, the most important addition to the advantages of the process of DSSCs cheaper and simpler to how to improve the flexible substrate to make the efficiency of the cel
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/94973338675758062093
Publikováno v:
Veterinary Record Open. 9
Publikováno v:
Risk Management and Healthcare Policy. 13:3039-3049
Background To continuously improve medical quality and provide clinicians with more accurate blood test reports, this study collected blood quality control data in 2017 from a medical examination laboratory in a teaching level hospital located in Tao
Publikováno v:
Veterinary Record Open; Dec2022, Vol. 9 Issue 1, p1-8, 8p
Autor:
Chen-Mao, Liao, Chih-Ming, Lin, Chin-Chia, Kuo, Ming-Shu, Chen, Chun-Yang, Huang, Ching-Yuan, Lin
Publikováno v:
Risk Management and Healthcare Policy
Background To continuously improve medical quality and provide clinicians with more accurate blood test reports, this study collected blood quality control data in 2017 from a medical examination laboratory in a teaching level hospital located in Tao
Autor:
Chi-Hsien Chung, Chiang Wei-Chieh, Kuo-Yu Chou, Tzu-Hsiang Chen, Tseng Chien-Hsien, Tung-Ting Wu, Takahashi Seiji, Chin-Chia Kuo, Chuan-Joung Wang, Huang Yimin, Dun-Nien Yaung, Chuang Chun-Hao, King Liao, Tung-Hsiung Tseng, Fu-Sheng Guo, Jhy-Jyi Sze, Hsu Wei-Cheng, Chou Keng-Yu
Publikováno v:
Sensors, Vol 17, Iss 12, p 2816 (2017)
Sensors; Volume 17; Issue 12; Pages: 2816
Sensors (Basel, Switzerland)
Sensors; Volume 17; Issue 12; Pages: 2816
Sensors (Basel, Switzerland)
A submicron pixel’s light and dark performance were studied by experiment and simulation. An advanced node technology incorporated with a stacked CMOS image sensor (CIS) is promising in that it may enhance performance. In this work, we demonstrated
Autor:
Chen-Shiung Chang, Chia-Hung Hsu, Forest Shih-Sen Chien, Chi-Yuan Lin, Chin-Chia Kuo, Wen-Feng Hsieh, Wei-Rein Liu, Bi-Hsuan Lin, Song Yang
Publikováno v:
RSC Advances. 5:12358-12364
Wurtzite ZnO epitaxial layers grown on n-type GaAs (001) by pulsed laser deposition (PLD) exhibited n-type conductivity. Post-growth annealing leads the conversion of carrier type from electron to hole, as revealed by Hall effect measurements, althou
Autor:
Chin-Chia Kuo, S. T. Hsu, Forest Shih-Sen Chien, Wen-Feng Hsieh, Chen-Shiung Chang, Che Yi Lin, Chia-Hung Hsu, Wei-Rein Liu, Sheng-Hsiung Yang, B. H. Lin
Publikováno v:
ACS Applied Materials & Interfaces. 4:5333-5337
High-quality m-plane orientated ZnO films have been successfully grown on m-plane sapphire by using radio frequency magnetron sputtering deposition. The introduction of a nanometer-thick, low-temperature-grown ZnO buffer layer effectively eliminates
Autor:
Chin Chia Kuo, Wen-Chih Chen
Publikováno v:
Journal of the Chinese Institute of Industrial Engineers. 27:294-303
Data envelopment analysis (DEA) is a mathematical programming approach for benchmarking. Using extreme observations to identify superior performance makes DEA vulnerable to outliers. While there are many studies on detecting outliers for DEA, most fo