Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Chieh-Yuan Chao"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 16:58-77
The high cost of capital equipment for production testing coupled with the time that an analog circuit spends on a tester has made it imperative to minimize average chip testing time during production. Testing time can be reduced by decreasing the nu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::325f616dd965e901a866d01b1a6ef5bd
https://doi.org/10.1109/43.559332
https://doi.org/10.1109/43.559332
Autor:
Chieh-Yuan Chao, L. Milor
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 8:239-251
Circuit designers need to be able to predict variations in circuit performance as a function of variations in process parameters. Often the relation between process parameters and circuit performances is highly nonlinear, and the process is described
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6d39e5c9da3d48268d1bc3e2ec8d5a59
https://doi.org/10.1109/66.400998
https://doi.org/10.1109/66.400998
Publikováno v:
[1992] Proceedings of the 35th Midwest Symposium on Circuits and Systems.
Attempts to reduce production testing time by presenting a fault-driven methodology to handle LSI analog circuits. A fault-driven methodology has to be able to detect both parametric and catastrophic faults. For statistical performance simulation to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0bf15485dc6f6eb2350178d05592bb0e
https://doi.org/10.1109/mwscas.1992.271146
https://doi.org/10.1109/mwscas.1992.271146
Autor:
L. Milor, Chieh-Yuan Chao
Publikováno v:
Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94.
Circuit designers need to be able to predict variations in circuit performance as a function of variations in process parameters. Often the relation between process parameters and circuit performances is highly nonlinear, and the process is described
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c2290d04aa56270a806d2c7015e7f37a
https://doi.org/10.1109/cicc.1994.379714
https://doi.org/10.1109/cicc.1994.379714