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An upgrade of an AMPTEK soft X-ray spectrometer with a silicon drift detector (SDD) to boost the output count rate is presented in the paper. Enhanced count rate is provided by a shaping electronic amplifier which forms pulses with a short rise time
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::77d4a50b6ebfe91f072f1fa11875174e
