Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Chiara Sandionigi"'
Autor:
Chiara Sandionigi, Olivier Heron
Publikováno v:
IOLTS
Aging of integrated circuits is recognized as a major reliability issue and the estimation of its effects is mandatory in the design of safety-critical systems. Fault injection is a valid method to evaluate the effects of faults on systems. This pape
Publikováno v:
DFT
Integrated circuits' aging is recognized as a key reliability bottleneck and its estimation at design time becomes mandatory to guarantee performance and lifetime of the circuit. Current approaches for the estimation of aging rely on simulation tools
Publikováno v:
2016 IEEE 22nd International Symposium on
Testing and Robust System Design (IOLTS)
Testing and Robust System Design (IOLTS), Jul 2016, Sant Feliu de Guixols, Spain. pp.51-53, ⟨10.1109/IOLTS.2016.7604671⟩
IOLTS
Testing and Robust System Design (IOLTS)
Testing and Robust System Design (IOLTS), Jul 2016, Sant Feliu de Guixols, Spain. pp.51-53, ⟨10.1109/IOLTS.2016.7604671⟩
IOLTS
Conference of 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 ; Conference Date: 4 July 2016 Through 6 July 2016; Conference Code:124500; International audience; Integrated circuits' aging is recognized as a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4df500f008c139c7aff13f5c0b432cb3
https://hal-cea.archives-ouvertes.fr/cea-01836856
https://hal-cea.archives-ouvertes.fr/cea-01836856
Autor:
Cristiana Bolchini, Chiara Sandionigi
Publikováno v:
IEEE Embedded Systems Letters. 2:107-110
This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology
Autor:
Hela Boussetta, Chiara Sandionigi, Nicolas Peltier, Tanguy Sassolas, Pascal Vivet, Alexandre Guerre, Julien Mottin
Publikováno v:
2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)
2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), Jul 2015, Rome, Italy. ⟨10.1109/ISLPED.2015.7273485⟩
ISLPED
2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED), Jul 2015, Rome, Italy. ⟨10.1109/ISLPED.2015.7273485⟩
ISLPED
International audience; Modern SoCs are characterized by increasing power density and consequently increasing temperature, that directly impacts performances, reliability and cost of a device through its packaging. Thermal issues need to be predicted
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae40ac5ed44763eaa2331153c5d01341
https://hal-cea.archives-ouvertes.fr/cea-01235183/file/ISLPED15.pdf
https://hal-cea.archives-ouvertes.fr/cea-01235183/file/ISLPED15.pdf
Autor:
Chiara Sandionigi, Olivier Heron
Publikováno v:
IOLTS
2015 IEEE 21st International
Testing Symposium (IOLTS)
Testing Symposium (IOLTS), Jul 2015, Halkidiki, Greece. pp.32-33, ⟨10.1109/IOLTS.2015.7229825⟩
2015 IEEE 21st International
Testing Symposium (IOLTS)
Testing Symposium (IOLTS), Jul 2015, Halkidiki, Greece. pp.32-33, ⟨10.1109/IOLTS.2015.7229825⟩
Conference of 21st IEEE International On-Line Testing Symposium, IOLTS 2015 ; Conference Date: 6 July 2015 Through 8 July 2015; Conference Code:117277; International audience; This paper proposes a method to select a set of paths representative of th
Autor:
Chiara Sandionigi, Cristiana Bolchini
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems
ACM Transactions on Design Automation of Electronic Systems, Association for Computing Machinery, 2014, 20, pp.16. ⟨10.1145/2676551⟩
ACM Transactions on Design Automation of Electronic Systems, 2014, 20, pp.16. ⟨10.1145/2676551⟩
ACM Transactions on Design Automation of Electronic Systems, Association for Computing Machinery, 2014, 20, pp.16. ⟨10.1145/2676551⟩
ACM Transactions on Design Automation of Electronic Systems, 2014, 20, pp.16. ⟨10.1145/2676551⟩
The aim of this article is the definition of a reliability-aware methodology for the design of embedded systems on multi-FPGA platforms. The designed system must be able to detect the occurrence of faults globally and autonomously, in order to recove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9495b290cbfdd47362560b86bffdec0
https://hal-cea.archives-ouvertes.fr/cea-01819900
https://hal-cea.archives-ouvertes.fr/cea-01819900
Autor:
Tanguy Sassolas, Chiara Sandionigi, Alexandre Guerre, Alexandre Aminot, Pascal Vivet, Hela Boussetta, Luca Ferro, Nicolas Peltier
Publikováno v:
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.327⟩
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.327⟩
Conference of 17th Design, Automation and Test in Europe, DATE 2014 ; Conference Date: 24 March 2014 Through 28 March 2014; Conference Code:104993; International audience; To offer more computing power to modern SoCs, transistors keep scaling in new
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::499b9333d9f0c9950cc35febd84b3ab0
https://hal-cea.archives-ouvertes.fr/cea-01817869
https://hal-cea.archives-ouvertes.fr/cea-01817869
Publikováno v:
2013 IEEE 19th International
Testing Symposium (IOLTS)
Testing Symposium (IOLTS), Jul 2013, Chania, Crete, Greece. pp.185-186, ⟨10.1109/IOLTS.2013.6604076⟩
IOLTS
Testing Symposium (IOLTS)
Testing Symposium (IOLTS), Jul 2013, Chania, Crete, Greece. pp.185-186, ⟨10.1109/IOLTS.2013.6604076⟩
IOLTS
Conference of 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013 ; Conference Date: 8 July 2013 Through 10 July 2013; Conference Code:99890; International audience; This paper investigates the problem of Bias Temperature Instability (
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b656909f147ce7c103149d7d9f752adc
https://cea.hal.science/cea-01839865
https://cea.hal.science/cea-01839865
Publikováno v:
Journal of Electronic Testing
Journal of Electronic Testing, Springer Verlag, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
Journal of Electronic Testing, Springer Verlag, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
Journal of Electronic Testing: : Theory and Applications
Journal of Electronic Testing: : Theory and Applications, 2013, 29, pp.127-141. ⟨10.1007/s10836-013-5368-x⟩
International audience; Die shrinking combined with the non-ideal scaling of voltage increases the probability of MOS transistors to encounter HCI. This mechanism causes timing degradation and possibly failures in ICs. The evaluation of timing degrad
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e6e006a73b1a42cdaf56b1bdb811a84
https://hal.archives-ouvertes.fr/hal-00950233
https://hal.archives-ouvertes.fr/hal-00950233