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pro vyhledávání: '"Chi-Lung Wu"'
Autor:
Chi-Lung Wu, 吳奇龍
105
The demand of customization is gradually increasing resulting from the global manufacturing development and the shorten product life cycle. In order to meet customer’s requirements and localization, suppliers have to provide a bunch of pro
The demand of customization is gradually increasing resulting from the global manufacturing development and the shorten product life cycle. In order to meet customer’s requirements and localization, suppliers have to provide a bunch of pro
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/fk3g8v
Autor:
Chi-Lung Wu, 吳啟綸
99
Ant System (AS) published in 1996. AS has made only a few years, but it performs well in saving various kind of questions than several modified versions have been developed, including Ant Memory System (AMS). AMS was developed by author and v
Ant System (AS) published in 1996. AS has made only a few years, but it performs well in saving various kind of questions than several modified versions have been developed, including Ant Memory System (AMS). AMS was developed by author and v
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/69804942904212586904
Autor:
Chi-lung Wu, 吳奇榮
95
The importance of education is well understood and elementary school teachers, who are standing on the front line of education, are carrying an immense mission regarding its quality. Teachers’ professional competency attracts great attentio
The importance of education is well understood and elementary school teachers, who are standing on the front line of education, are carrying an immense mission regarding its quality. Teachers’ professional competency attracts great attentio
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/63311937698713045190
Autor:
Chi-Lung Wu, 吳奇隆
92
We propose a new method of solving the optical constants for Vacuum Ultraviolet lithography. We measure the reflectance of multi-angles incidence and then use the thin film model to solve the optical constants of materials. We discuss the opt
We propose a new method of solving the optical constants for Vacuum Ultraviolet lithography. We measure the reflectance of multi-angles incidence and then use the thin film model to solve the optical constants of materials. We discuss the opt
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/e88rww
Autor:
Chi Lung Wu, Tetsuhiro Kudo, Ken-ichi Yuyama, Hiroshi Masuhara, Teruki Sugiyama, Shun Fa Wang
Publikováno v:
Langmuir. 36:14234-14242
We demonstrated the optical trapping-induced formation of a single large disc-like assembly (∼50 μm in diameter) of polystyrene (PS) nanoparticles (NPs) (100 nm in diameter) at a solution surface. Different from the conventional trapping behavior
Publikováno v:
Digest of Papers. 2004 International Microprocesses and Nanotechnology Conference, 2004..
Publikováno v:
2004 Digest of Papers. 2004 International Microprocesses & Nanotechnology Conference; 2004, p40-41, 2p