Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Chi-Lin Young"'
Autor:
Chia-Sheng Cheng, Chee Jen Chang, Shih-An Tsai, Tsung-Kuan A. Chou, We-Juin Su, Chia-Jung Lu, Julin Tang, Li-Peng Wang, Yueh-ting Tsai, Shih-Chi Chu, Ching-Lin Hsiao, Chi-Lin Young, Alicia H. Chang, Chien-Lin Huang
Publikováno v:
C107. PROGRESS IN BIOMARKERS AND DIAGNOSTICS FOR RESPIRATORY INFECTIONS.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f925509f39303134531acb1bd500f7d
https://doi.org/10.1164/ajrccm-conference.2012.185.1_meetingabstracts.a6868
https://doi.org/10.1164/ajrccm-conference.2012.185.1_meetingabstracts.a6868
Autor:
Jim Vickers, Radu Ispasoiu, Chi-Lin Young, Paul Ng, Dan Cotton, Francisco Contreras, Chris Shaw
Publikováno v:
International Symposium for Testing and Failure Analysis.
Ultra low voltage probing by time resolved emission (TRE) technology below 1.0V is very challenging for micro-processor debug in practical operation condition. This is because the photo-emission rate reduces exponentially as the power supply voltage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::74d08fd8d720fef8309f36cdda38cee0
https://doi.org/10.31399/asm.cp.istfa2007p0161
https://doi.org/10.31399/asm.cp.istfa2007p0161
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents the first single element time resolved emission (TRE) data collected from microprocessors fabricated with 0.13 µm process silicon using tester loop lengths, and in many cases acquisition times, comparable to laser voltage probing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c2fe420ad707cbbff896abb63162064
https://doi.org/10.31399/asm.cp.istfa2002p0741
https://doi.org/10.31399/asm.cp.istfa2002p0741