Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Cheyun Lin"'
Autor:
Mahjabin Maksud, Hannes Greve, Daniel Pantuso, Chetan Prasad, K. W. Park, Benjamin J. Orr, Peng Bai, I-chen Ho, Steven R. Novak, Zhizheng Zhang, D. Ingerly, Michael P. O'Day, Cheyun Lin, Enamul Kabir, Emre Armagan, Sunny Chugh, Patrick N. Stover, Lance C. Hibbeler, A. Schmitz, Hsinwei Wu
Publikováno v:
IRPS
This work presents silicon reliability characterization of Intel’s Foveros three-dimensional (3D) logic-on-logic stacking technology implemented on the 22FFL process node. Simulations and data demonstrate mechanical strain safe zones around Through
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::689880d48e87d8e5dfb8a1916e08af40
https://doi.org/10.1109/irps45951.2020.9129277
https://doi.org/10.1109/irps45951.2020.9129277
Publikováno v:
2009 IEEE/LEOS Winter Topicals Meeting Series; 2009, p73-74, 2p
Publikováno v:
2009 IEEE Avionics, Fiber-Optics & Phototonics & Photonics Technology Conference; 2009, p86-87, 2p
Publikováno v:
Optics Letters; 3/15/2011, Vol. 36 Issue 6, p73-73, 1p
Publikováno v:
Optics Letters; 11/1/2009, Vol. 34 Issue 21, p57-57, 1p
Publikováno v:
Optics Letters; 10/15/2009, Vol. 34 Issue 20, p23-23, 1p