Zobrazeno 1 - 10
of 195
pro vyhledávání: '"Cherukara, Mathew J."'
Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by the converge
Externí odkaz:
http://arxiv.org/abs/2406.07761
Ptychography is a powerful imaging technique that is used in a variety of fields, including materials science, biology, and nanotechnology. However, the accuracy of the reconstructed ptychography image is highly dependent on the accuracy of the recor
Externí odkaz:
http://arxiv.org/abs/2405.20910
Autor:
Myint, Peco, Tripathi, Ashish, Wojcik, Michael J., Deng, Junjing, Cherukara, Mathew J., Schwarz, Nicholas, Narayanan, Suresh, Wang, Jin, Chu, Miaoqi, Jiang, Zhang
Many nano and quantum devices, with their sizes often spanning from millimeters down to sub-nanometer, have intricate low-dimensional, non-uniform, or hierarchical structures on surfaces and interfaces. Since their functionalities are dependent on th
Externí odkaz:
http://arxiv.org/abs/2402.06762
Autor:
Prince, Michael H., Chan, Henry, Vriza, Aikaterini, Zhou, Tao, Sastry, Varuni K., Dearing, Matthew T., Harder, Ross J., Vasudevan, Rama K., Cherukara, Mathew J.
Upgrades to advanced scientific user facilities such as next-generation x-ray light sources, nanoscience centers, and neutron facilities are revolutionizing our understanding of materials across the spectrum of the physical sciences, from life scienc
Externí odkaz:
http://arxiv.org/abs/2312.01291
Autor:
Andrejevic, Nina, Zhou, Tao, Zhang, Qingteng, Narayanan, Suresh, Cherukara, Mathew J., Chan, Maria K. Y.
Publikováno v:
npj Comput Mater 10, 225 (2024)
Coherent X-ray scattering (CXS) techniques are capable of interrogating dynamics of nano- to mesoscale materials systems at time scales spanning several orders of magnitude. However, obtaining accurate theoretical descriptions of complex dynamics is
Externí odkaz:
http://arxiv.org/abs/2311.14196
Autor:
McCray, Arthur R. C., Zhou, Tao, Kandel, Saugat, Petford-Long, Amanda, Cherukara, Mathew J., Phatak, Charudatta
The manipulation and control of nanoscale magnetic spin textures is of rising interest as they are potential foundational units in next-generation computing paradigms. Achieving this requires a quantitative understanding of the spin texture behavior
Externí odkaz:
http://arxiv.org/abs/2307.09625
Autor:
Horwath, James P., Lin, Xiao-Min, He, Hongrui, Zhang, Qingteng, Dufresne, Eric M., Chu, Miaoqi, Sankaranarayanan, Subramanian K. R. S., Chen, Wei, Narayanan, Suresh, Cherukara, Mathew J.
Understanding and interpreting dynamics of functional materials \textit{in situ} is a grand challenge in physics and materials science due to the difficulty of experimentally probing materials at varied length and time scales. X-ray photon correlatio
Externí odkaz:
http://arxiv.org/abs/2212.03984
Autor:
Myint, Peco, Chu, Miaoqi, Tripathi, Ashish, Wojcik, Michael J., Zhou, Jian, Cherukara, Mathew J., Narayanan, Suresh, Wang, Jin, Jiang, Zhang
To study nanostructures on substrates, surface-sensitive reflection-geometry scattering techniques such as grazing incident small angle x-ray scattering are commonly used to yield an averaged statistical structural information of the surface sample.
Externí odkaz:
http://arxiv.org/abs/2212.01253
Autor:
Babu, Anakha V, Zhou, Tao, Kandel, Saugat, Bicer, Tekin, Liu, Zhengchun, Judge, William, Ching, Daniel J., Jiang, Yi, Veseli, Sinisa, Henke, Steven, Chard, Ryan, Yao, Yudong, Sirazitdinova, Ekaterina, Gupta, Geetika, Holt, Martin V., Foster, Ian T., Miceli, Antonino, Cherukara, Mathew J.
Coherent microscopy techniques provide an unparalleled multi-scale view of materials across scientific and technological fields, from structural materials to quantum devices, from integrated circuits to biological cells. Driven by the construction of
Externí odkaz:
http://arxiv.org/abs/2209.09408
Autor:
Strempfer, Sebastian, Zhou, Tao, Yoshii, Kazutomo, Hammer, Mike, Babu, Anakha, Bycul, Dawid, Weizeorick, John, Cherukara, Mathew J., Miceli, Antonino
Today, most X-ray pixel detectors used at light sources transmit raw pixel data off the detector ASIC. With the availability of more advanced ASIC technology nodes for scientific application, more digital functionality from the computing domains (e.g
Externí odkaz:
http://arxiv.org/abs/2208.00069