Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Cherq Chua"'
Publikováno v:
Virtual and Physical Prototyping, Vol 18, Iss 1 (2023)
Lattice structures are widely used in the industry for aerospace, automotive and biomedical applications as they are strong yet lightweight. Due to the complex geometry, lattice structures are mostly fabricated with additive manufacturing (AM). Despi
Externí odkaz:
https://doaj.org/article/56fa2daaea13455bad5a08fe425564b7
Publikováno v:
IEEE Transactions on Electron Devices. 70:1509-1519
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c8fa6babab842bfaedde57f9afc98dc
https://doi.org/10.1109/ted.2023.3236903
https://doi.org/10.1109/ted.2023.3236903
Publikováno v:
Materials Today: Proceedings. 70:616-621
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fac0a79f23c0e85592b1d4d955f0be4f
https://doi.org/10.1016/j.matpr.2022.09.619
https://doi.org/10.1016/j.matpr.2022.09.619
Publikováno v:
IEEE Transactions on Plasma Science. :1-15
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3cdf68b1274c7b2b41b47c6f91e258d
https://doi.org/10.1109/tps.2022.3173469
https://doi.org/10.1109/tps.2022.3173469
Publikováno v:
Virtual and Physical Prototyping. 18
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c24433f358ab59ce54ef75d4150627df
https://doi.org/10.1080/17452759.2022.2138463
https://doi.org/10.1080/17452759.2022.2138463
Publikováno v:
Web of Science
Two-dimensional (2D) layered dielectrics offers a compelling route towards the design of next-generation ultimately compact nanoelectronics. Motivated by recent high-throughput computational prediction of LaO$X$ ($X$ = Br, Cl) as an exceptional 2D di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9d2e05c535e96c17260b2a453717d7e3
Publikováno v:
Physical Review Applied. 16
For field emission (FE), it is widely expected that its emitting current density $J$ will become space-charge-limited current (SCLC) due the built-up of charge in-transit within a gap spacing $D$ biased at sufficiently large voltage $V$. In this pape
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1794766a98013ffab9d84d1aa0dec549
https://doi.org/10.1103/physrevapplied.16.064025
https://doi.org/10.1103/physrevapplied.16.064025
Publikováno v:
2021 IEEE International Conference on Plasma Science (ICOPS).
The transition from source limited electron emission like field emission at low voltage to bulk transport limited by space charge effects at high voltage is widely accepted. In this paper, we report that this understanding is no longer valid if the f
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8d4b8a622d46e486dcd741bae6c2410
https://doi.org/10.1109/icops36761.2021.9588454
https://doi.org/10.1109/icops36761.2021.9588454
Publikováno v:
Applied Physics Letters. 121:192109
For a biased trap-filled insulator, the current transport is governed by the physics of charge injection from the metallic electrode and also the trap-limited space-charge conduction in the insulator. With a Schottky barrier at the interface of the m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::044ab3f2dafd71d9520d08b6a411d68c
https://doi.org/10.1063/5.0124748
https://doi.org/10.1063/5.0124748
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
With the emergence of non-FN based field emitters, the establish transition from source-limited field emission (FE) at low voltage to space-charge-limited current (SCLC) at high voltage is no longer valid. In this paper, we predict a critical pre-fac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::600deb1c03a3bd73a474997082045a0f
https://doi.org/10.1109/ivnc52431.2021.9600755
https://doi.org/10.1109/ivnc52431.2021.9600755