Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Cheng-Yun Hsieh"'
Autor:
Cheng-Yun Hsieh, 謝承運
105
Resuming Administrative Procedure (wiederaufgreifen des Verfahrens) is the procedure established in Article 128 of Taiwanese Administrative Procedure Law, which allows respondents who are subject to an administrative disposition or other inv
Resuming Administrative Procedure (wiederaufgreifen des Verfahrens) is the procedure established in Article 128 of Taiwanese Administrative Procedure Law, which allows respondents who are subject to an administrative disposition or other inv
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/6v663g
Publikováno v:
ITC
Researchers now use randomized benchmarking or quantum volume to test quantum circuits (QC) in the laboratory. However, these tests are long and their fault coverage is unclear. In this paper, we propose behavior fault models based on the function of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c3fecbb2feaff3b706528833c6df0f9
https://doi.org/10.1109/itc44778.2020.9325228
https://doi.org/10.1109/itc44778.2020.9325228
Publikováno v:
ITC-Asia
Probabilistic circuits are a potential solution for low power designs which trade off correctness for power consumption. The behavior of probabilistic circuits are more complicated than deterministic circuits because the former produce different outp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bbc4bbe8a3b1f45861c9b23680668011
https://doi.org/10.1109/itc-asia51099.2020.00026
https://doi.org/10.1109/itc-asia51099.2020.00026
Publikováno v:
DAC
Testing for quantum circuits (QC) is a challenging task because QC is intrinsically probabilistic. Existing fault models for QC, such as missing gate faults, are not suitable for quantum dot QC. This paper proposes realistic fault models and fault si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7acb0a95820393a0a642a6384442dd9e
https://doi.org/10.1109/dac18072.2020.9218573
https://doi.org/10.1109/dac18072.2020.9218573
Publikováno v:
DAC: Annual ACM/IEEE Design Automation Conference; 2020, Issue 57, p269-274, 6p