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pro vyhledávání: '"Cheng, Tsz Wa"'
Autor:
Tang, Jiaqi, Lu, Hao, Xu, Xiaogang, Wu, Ruizheng, Hu, Sixing, Zhang, Tong, Cheng, Tsz Wa, Ge, Ming, Chen, Ying-Cong, Tsung, Fugee
Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Increment
Externí odkaz:
http://arxiv.org/abs/2312.08917
