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pro vyhledávání: '"Chen-Yu Shieh"'
Autor:
Chen-Yu Shieh, 謝鎮宇
103
The epitaxial layer of InGaN-based light-emitting diodes (LEDs) still contain a high defect density (around 108-1010 cm-2) and large strain-induced piezoelectric field due to the large lattice mismatch and the difference in thermal expansi
The epitaxial layer of InGaN-based light-emitting diodes (LEDs) still contain a high defect density (around 108-1010 cm-2) and large strain-induced piezoelectric field due to the large lattice mismatch and the difference in thermal expansi
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/02005784314033622653
Autor:
Chen-yu Shieh, 謝鎮宇
96
A procedure is discussing about current blocking in the LED of GaN. And designing geometric patterns of contact electrodes affects light-extraction on total photoelectric factors. By the design begin simulation and analysis. Then this thesis
A procedure is discussing about current blocking in the LED of GaN. And designing geometric patterns of contact electrodes affects light-extraction on total photoelectric factors. By the design begin simulation and analysis. Then this thesis
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/14945168884413837850
Autor:
Chen-Yu Shieh, Chun-Wei Tsai
Publikováno v:
SID Symposium Digest of Technical Papers. 52:344-346
Publikováno v:
SID Symposium Digest of Technical Papers. 52:27-28
Publikováno v:
SID Symposium Digest of Technical Papers. 52:303-304
Publikováno v:
Materials Chemistry and Physics. 157:63-68
In this work, a buffer layer of nitrided titanium (Ti) achieved through the nitridation of a Ti metal layer on a sapphire substrate was used for the epitaxial growth of InGaN-based light-emitting diodes (LEDs) achieved by low pressure metal-organic c
Publikováno v:
Handbook of Advanced Lighting Technology ISBN: 9783319002958
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c8ac4e11bee9bc68303fe5d4ab31ca93
https://doi.org/10.1007/978-3-319-00295-8_10-1
https://doi.org/10.1007/978-3-319-00295-8_10-1
Publikováno v:
SPIE Proceedings.
We reported the defects and optical characterizations of the ultraviolet light-emitting diodes grown on free-standing GaN substrate (FS-GaN) and sapphire. Cross-sectional transmission electron microscopy (TEM) images showed that the total defect dens
Publikováno v:
SPIE Proceedings.
We reported the influence of free-standing (FS) GaN substrate on ultraviolet light-emitting-diodes (UV LEDs) by atmospheric-pressure metal-organic chemical vapor deposition (APMOCVD). The Raman spectrum shows the in-plane compressive stress of the Ga
Autor:
Wei-I Lee, Zhen-Yu Li, J. Y. Chang, Chen Yu Shieh, Gou Chung Chi, Hao-Chung Kuo, Ming Ta Tsai
Publikováno v:
Journal of Nanophotonics. 8:083081
We investigated the influence of free-standing GaN (FS-GaN) substrates on the performance of ultraviolet light-emitting-diodes (UV-LEDs) grown on top by atmospheric pressure metal-organic chemical vapor deposition. High-resolution double-crystal x-ra