Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Chen Tung Hung"'
Publikováno v:
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Scaling of TEM specimen thickness is vital to avoid overlapped semiconductor device structures due to the shrinking of device geometry and to obtain good high-resolution TEM images. Nevertheless, thinner TEM specimen fabricated by conventional ex-sit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e1419907052c8920063b7d06b6931e5
https://doi.org/10.1109/ipfa.2015.7224349
https://doi.org/10.1109/ipfa.2015.7224349
Autor:
Liao, Wen-Shiang, Lin, Hsin-Hung, Liu, Yu-Huan, Tang, Mao-Chyuan, Huang, Sheng-Yi, Wu, Cheng-Han, Liaw, Yue-Gie, Chen, Tung-Hung, Shih, Tommy, Chen, Kun-Ming
Publikováno v:
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p69233Y-69233Y-7, 7p
Autor:
Liao, Wen-Shiang, Wu, Cheng-Han, Tang, Mao-Chyuan, Huang, Sheng-Yi, Shih, Tommy, Liaw, Yue-Gie, Chen, Kun-Ming, Chen, Tung-Hung, Tsen, Huan-Chiu, Chung, Lee
Publikováno v:
Proceedings of SPIE; Nov2008, Issue 1, p69212N-69212N-6, 6p
Autor:
Liao, Wen-Shiang, Liu, Yu-Huan, Chang, Wen-Tung, Chen, Tung-Hung, Shih, Tommy, Tsen, Huan-Chiu, Chung, Lee
Publikováno v:
Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65204N-65204N-5, 5p
Autor:
Liao, Wen-Shiang, Chen, Tung-Hung, Lin, Hsin-Hung, Chang, Wen-Tung, Shih, Tommy, Tsen, Huan-Chiu, Chung, Lee
Publikováno v:
Proceedings of SPIE; Nov2007 Part 2, Issue 1, p65204P-65204P-6, 6p
Autor:
Chen SC; Department of Veterinary Medicine, National Pingtung University of Science and Technology, Pingtung 912, Taiwan, ROC. scchen@mail.npust.edu.tw, Chen TH, Wang PC, Chen YC, Huang JP, Lin YD, Chaung HC, Liaw LL
Publikováno v:
Diseases of aquatic organisms [Dis Aquat Organ] 2003 Jul 08; Vol. 55 (2), pp. 161-7.