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pro vyhledávání: '"Chen, Zhenzhou Tian"'
Publikováno v:
Electronics; Volume 12; Issue 11; Pages: 2495
The explosive growth of vulnerabilities poses a significant threat to the security of software systems. While various deep-learning-based vulnerability detection methods have emerged, they primarily rely on semantic features extracted from a single c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::c2a513cd37bebbbd0c3bbc5f857037c5
