Reliability assessment of Ti/TaSi[sub 2]/Pt ohmic contacts on SiC after 1000 h at 600 °C.

Autor: Okojie, Robert S., Lukco, Dorothy, Chen, Yuanliang L., Spry, David J.

Publikováno v: Journal of Applied Physics; 5/15/2002 Part 1, 2 & 3, Vol. 91 Issue 10, p6553, 7p, 2 Black and White Photographs, 7 Graphs