Zobrazeno 1 - 10
of 348
pro vyhledávání: '"Chen, Mingzhou"'
Publikováno v:
In International Journal of Disaster Risk Reduction August 2024 110
Publikováno v:
In Expert Systems With Applications 15 April 2024 240
Autor:
Zhang, Qiang, Ye, Hanzhe, Liu, Cong, Zhou, Haiwu, He, Mingbin, Liang, Xiaodong, Zhou, Yu, Wang, Kun, Qin, Yali, Li, Zhifei, Chen, Mingzhou
Publikováno v:
In Virologica Sinica April 2024 39(2):235-250
Optical trapping describes the interaction between light and matter to manipulate micro-objects through momentum transfer. In the case of 3D trapping with a single beam, this is termed optical tweezers. Optical tweezers are a powerful and non-invasiv
Externí odkaz:
http://arxiv.org/abs/2104.01213
Non-intrusive detection systems have the potential to characterise materials through various transparent glass and plastic containers. Food and drink adulteration is increasingly problematic, representing a serious health risk as well as an economic
Externí odkaz:
http://arxiv.org/abs/2005.13538
Publikováno v:
Opt. Lett. 45, 1926-1929 (2020)
Many areas of optical science require an accurate measurement of optical spectra. Devices based on laser speckle promise compact wavelength measurement, with attometer-level sensitivity demonstrated for single wavelength laser fields. The measurement
Externí odkaz:
http://arxiv.org/abs/1910.13411
Publikováno v:
In Expert Systems With Applications 15 October 2023 228
Publikováno v:
In Information Sciences September 2023 643
Publikováno v:
Optics Letters 44, 1367-1370 (2019)
The measurement of the wavelength of light using speckle is a promising tool for the realization of compact and precise wavemeters and spectrometers. However, the resolution of these devices is limited by strong correlations between the speckle patte
Externí odkaz:
http://arxiv.org/abs/1909.00666
Autor:
Wijesinghe, Philip, Escobet-Montalbán, Adrià, Chen, Mingzhou, Munro, Peter R T, Dholakia, Kishan
Compressive sensing can overcome the Nyquist criterion and record images with a fraction of the usual number of measurements required. However, conventional measurement bases are susceptible to diffraction and scattering, prevalent in high-resolution
Externí odkaz:
http://arxiv.org/abs/1907.02272