Humane response to water crisis.

Autor: Pal, Surajit Kumar

Publikováno v: Journal of the Indian Anthropological Society. Mar2013, Vol. 48 Issue 1, p109-112. 4p.

Broadband Tunable Infrared Light Emission from Metal-Oxide-Semiconductor Tunnel Junctions in Silicon Photonics.

Autor: Doderer M; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Keller K; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Winiger J; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Baumann M; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Messner A; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Moor D; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Chelladurai D; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Fedoryshyn Y; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Leuthold J; Institute of Electromagnetic Fields (IEF), ETH Zurich, 8092 Zurich, Switzerland., Strait J; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Agrawal A; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Lezec HJ; Physical Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States., Haffner C; Interuniversity Microelectronics Centre (imec), Remisebosweg 1, 3001 Leuven, Belgium.

Publikováno v: Nano letters [Nano Lett] 2024 Jan 24; Vol. 24 (3), pp. 859-865. Date of Electronic Publication: 2023 Dec 05.

C- and O-Band Dual-Polarization Fiber-to-Chip Grating Couplers for Silicon Nitride Photonics.

Autor: Kohli M; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Chelladurai D; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Vukovic B; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Moor D; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Bisang D; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Keller K; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Messner A; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Buriakova T; Ligentec SA, 1024 Ecublens, Switzerland., Zervas M; Ligentec SA, 1024 Ecublens, Switzerland., Fedoryshyn Y; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Koch U; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland., Leuthold J; ETH Zurich, Institute of Electromagnetic Fields (IEF), 8092 Zürich, Switzerland.; Ligentec SA, 1024 Ecublens, Switzerland.

Publikováno v: ACS photonics [ACS Photonics] 2023 Aug 30; Vol. 10 (9), pp. 3366-3373. Date of Electronic Publication: 2023 Aug 30 (Print Publication: 2023).

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