Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Che-hao Chuang"'
Autor:
Che-hao Chuang, 莊哲豪
97
In this thesis, a nonlinear H∞/LTR control law, which is capable of tracking desired reference inputs and matching prescribed specifications, is developed. To cope with some nonlinear dynamic systems which include both unknown parameters an
In this thesis, a nonlinear H∞/LTR control law, which is capable of tracking desired reference inputs and matching prescribed specifications, is developed. To cope with some nonlinear dynamic systems which include both unknown parameters an
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/60162678249801215830
Autor:
Che-Hao Chuang, 莊哲豪
97
AISI 1005 steel was coated by hot-dipping into a molten pure aluminum, and then underwent an anodizing treatment to form an anodic oxide layer on the coating surface. The corrosion behavior of the modified aluminide steel was analyzed by imme
AISI 1005 steel was coated by hot-dipping into a molten pure aluminum, and then underwent an anodizing treatment to form an anodic oxide layer on the coating surface. The corrosion behavior of the modified aluminide steel was analyzed by imme
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/53667859144585051307
Autor:
Che-Hao Chuang, 莊哲豪
89
In this thesis, the influence on ESD robustness with the different ESD implantations and layout design on gate-grounded NMOS (GGNMOS) and gate-VDD PMOS are investigated in a 0.18-µm salicided CMOS technology. A novel diode structure to avoid
In this thesis, the influence on ESD robustness with the different ESD implantations and layout design on gate-grounded NMOS (GGNMOS) and gate-VDD PMOS are investigated in a 0.18-µm salicided CMOS technology. A novel diode structure to avoid
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/92121947857244565886
Autor:
Che-Hao Chuang, 莊喆豪
99
Eyes and its associated structures are important not only for vision but also for facial beauty. In Taiwan, orbital blow-out fractures are frequent due to popularity of motorcycle traffic accident. Recognized sequelae of orbital blow-out frac
Eyes and its associated structures are important not only for vision but also for facial beauty. In Taiwan, orbital blow-out fractures are frequent due to popularity of motorcycle traffic accident. Recognized sequelae of orbital blow-out frac
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/17937743017742820651
System-Level ESD Protection for Automotive Electronics by Co-Design of TVS and CAN Transceiver Chips
Autor:
Ming-Dou Ker, Che-Hao Chuang
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 17:570-576
This paper proposed a co-packaged methodology using transient voltage suppressor (TVS) chips and a controller area network (CAN) bus transceiver to ensure IEC 61000-4-2 system-level ESD protection. The design methodology is verified in a high-voltage
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ca45252d2e739fad0ba86614b3cafc9
https://doi.org/10.1109/tdmr.2017.2737943
https://doi.org/10.1109/tdmr.2017.2737943
Autor:
Ming-Dou Ker, Che-Hao Chuang
Publikováno v:
IEEE Transactions on Industrial Electronics. 61:5615-5621
A novel on-chip transient voltage suppressor (TVS) integrated with the silicon-based transceiver IC has been proposed and verified in a 0.8 μm bipolar CMOS DMOS (BCD) process for IEC 61000-4-2 system-level electrostatic discharge (ESD) protection. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e69a05a22db977159600a5fc320040c
https://doi.org/10.1109/tie.2013.2297292
https://doi.org/10.1109/tie.2013.2297292
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 6:102-111
Different electrostatic discharge (ESD) protection schemes have been investigated to find the optimal ESD protection design for an analog input/output (I/O) buffer in 0.18-/spl mu/m 1.8- and 3.3-V CMOS technology. Three power-rail ESD clamp devices w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::12cb577f4895407d79cb1cf6b1be6069
https://doi.org/10.1109/tdmr.2006.871414
https://doi.org/10.1109/tdmr.2006.871414
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. 18:328-337
One method to enhance electrostatic discharge (ESD) robustness of the on-chip ESD protection devices is through process design by adding an extra "ESD implantation" mask. In this work, ESD robustness of nMOS devices and diodes with different ESD impl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c392544a249259a21f1b756d3c69bd4
https://doi.org/10.1109/tsm.2005.845100
https://doi.org/10.1109/tsm.2005.845100
Publikováno v:
IEICE Transactions on Electronics. :429-436
New diode structures without the field-oxide boundary across the p/n junction for ESD protection are proposed. A NMOS (PMOS) is especially inserted into the diode structure to form the NMOS-bounded (PMOS-bounded) diode, which is used to block the fie
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e0cf4e835d66a77aed5e447face5f82
https://doi.org/10.1093/ietele/e88-c.3.429
https://doi.org/10.1093/ietele/e88-c.3.429
Publikováno v:
2011 IEEE International Conference on IC Design & Technology.
The on-chip Transient Voltage Suppressor (TVS) embedded in the silicon based transceiver IC has been proposed in this paper by using 0.8 μm Bipolar-CMOS-DMOS (BCD) process. The structure of the on-chip TVS is a high voltage Dual Silicon-Controlled-R
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85492fb619af968c4cebe1266f22873f
https://doi.org/10.1109/icicdt.2011.5783236
https://doi.org/10.1109/icicdt.2011.5783236