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pro vyhledávání: '"Che-Yuan Jao"'
Autor:
I-Cheng Lin, Chen-Feng Chiang, Che-Yuan Jao, Bo-Shih Huang, Rei-Fu Huang, Chien-Hui Chuang, Cheng-Hsing Chien
Publikováno v:
2009 IEEE International Reliability Physics Symposium.
Latchup test failures occurred at two IO pins of an IC. Failure analysis revealed damage at the ESD device of a neighboring power pin's ESD protection circuit. To identify the root cause of the problem, the behavior of the ESD circuit in response to