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pro vyhledávání: '"Che-Lun Hu"'
Publikováno v:
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE.
This study originates from IEC 61967-4 standards for measuring electromagnetic emissions at the chip level. The measuring probe with fixed SMA connector in IEC 61967-4 method was improved with a proposed radio frequency (RF) current probe by featurin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::266ac9813f7689e40ce91428e9418ff2
https://doi.org/10.1109/emceurope.2017.8094779
https://doi.org/10.1109/emceurope.2017.8094779
