Zobrazeno 1 - 10
of 189
pro vyhledávání: '"Chauveau, T."'
Autor:
Belmeguenai, M., Tuzcuoglu, H., Gabor, M. S., Petrisor jr, T., Tiusan, C., Berling, D., Zighem, F., Chauveau, T., Chérif, S. M., Moch, P.
Publikováno v:
Phys. Rev. B 87, 184431 (2013)
Co2FeAl (CFA) thin films with thickness varying from 10 nm to 115 nm have been deposited on MgO(001) substrates by magnetron sputtering and then capped by Ta or Cr layer. X-rays diffraction (XRD) revealed that the cubic $[001]$ CFA axis is normal to
Externí odkaz:
http://arxiv.org/abs/1305.0714
Publikováno v:
Journal of Superhard Materials, 32 [4] 231-235 (2010)
The structure of graphite-like BCx phases (x = 1, 1.5, 3, 4, 32) has been studied using conventional X-ray diffraction. The results have been obtained, which unambiguously point to turbostratic (one- dimensionally disordered) structure of all phases
Externí odkaz:
http://arxiv.org/abs/1101.2955
Autor:
Dirras, G., Lilensten, L., Djemia, P., Laurent-Brocq, M., Tingaud, D., Couzinié, J.-P., Perrière, L., Chauveau, T., Guillot, I.
Publikováno v:
In Materials Science & Engineering A 27 January 2016 654:30-38
Autor:
Chauveau, T.1 chauveau.typhaine@gmail.com
Publikováno v:
Douleur et Analgésie. jui2021, Vol. 34 Issue 2, p132-135. 4p.
Publikováno v:
In Materials Characterization June 2015 104:31-41
Publikováno v:
In Materials Science & Engineering A 15 July 2013 575:94-103
Publikováno v:
In Materials Science & Engineering A 20 June 2013 573:222-233
Publikováno v:
In Journal of Alloys and Compounds 25 September 2012 536 Supplement 1:S381-S385
Publikováno v:
In Materials Characterization January 2011 62(1):22-34
Publikováno v:
In Materials Science & Engineering A 2010 527(16):4128-4135