Nanostructure engineering of epitaxial piezoelectric {\alpha}-quartz thin films on silicon

Autor: Zhang, Q., Sánchez-garcia, D., Desgarceaux, R., Gomez, A., Escofet-Majora, P., Oró-soler, J., Gazquez, J., Larrieu, G., Charlot, B., Gich, M., Carretero-Genevrier, A.

The monolithic integration of sub-micron quartz structures on silicon substrates is a key issue for the future development of telecommunication to the GHz frequencies. Here we report unprecedented large-scale fabrication of ordered arrays of piezoele

Externí odkaz: http://arxiv.org/abs/1908.07016

Temperature measurement of sub-micrometric ICs by scanning thermal microscopy

Autor: Gomès, S., Chapuis, Po, Nepveu, F., Trannoy, N., Volz, S., Charlot, B., Tessier, Gilles, Dilhaire, S., Cretin, Bernard, Vairac, Pascal

Publikováno v: IEEE Transactions on Components and Packaging Technologies 30, 3 (2007) 424-431

Surface temperature measurements were performed with a Scanning Thermal Microscope mounted with a thermoresistive wire probe of micrometrSurface temperature measurements were performed with a Scanning Thermal Microscope mounted with a thermoresistive

Externí odkaz: http://arxiv.org/abs/0711.4530

Droplet generation for thermal transient stimulation of pyroelectric PZT element

Autor: Charlot, B., Coudouel, D., Very, F., Combette, P., Giani, A.

Publikováno v: In Sensors & Actuators: A. Physical 15 April 2015 225:103-110

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High resolution photonic force microscopy based on sharp nano-fabricated tips

Autor: Desgarceaux R., Santybayeva Z., Battistella E., Nord A.L., Braun-Breton C., Abkarian M., Marago O.M., Charlot B., Pedaci F.

Publikováno v: Nano Letters
Nano Letters, American Chemical Society, 2020, 20 (6), pp.4249-4255. ⟨10.1021/acs.nanolett.0c00729⟩
Nano letters
20 (2020): 4249–4255. doi:10.1021/acs.nanolett.0c00729
info:cnr-pdr/source/autori:Desgarceaux R.; Desgarceaux R.; Santybayeva Z.; Battistella E.; Nord A.L.; Braun-Breton C.; Abkarian M.; Marago O.M.; Charlot B.; Pedaci F./titolo:High-Resolution Photonic Force Microscopy Based on Sharp Nanofabricated Tips/doi:10.1021%2Facs.nanolett.0c00729/rivista:Nano letters (Print)/anno:2020/pagina_da:4249/pagina_a:4255/intervallo_pagine:4249–4255/volume:20

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the deformations ind

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::667d2438c99363b3f7c473a46c1ca416
http://arxiv.org/abs/2002.01533