Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Charles Slayman"'
Publikováno v:
IEEE Transactions on Nuclear Science. 66:140-147
The JESD89 test standard defines how terrestrial neutron testing is conducted [1] . The test standard covers a number of different types of radiation used for testing, including protons, neutrons, and alphas, and different types of testing, including
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d7a793fb3e788797ad345a9ce7bd096
https://doi.org/10.1109/tns.2018.2884908
https://doi.org/10.1109/tns.2018.2884908
Autor:
Michael Trinczek, Charles Slayman, Richard Wong, Ewart W. Blackmore, Shi-Jie Wen, Matthew Stukel
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2792-2796
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dcc1708daba67d6ad95513775218dbee
https://doi.org/10.1109/tns.2015.2498103
https://doi.org/10.1109/tns.2015.2498103
Autor:
Kai Ni, T. R. Assis, S.-J. Wen, Rick Wong, Lloyd W. Massengill, Bharat L. Bhuva, Charles Slayman, Ronald D. Schrimpf, Jeffrey S. Kauppila
Publikováno v:
IEEE Transactions on Nuclear Science. 62:2853-2859
The ambipolar-diffusion-with-cutoff (ADC) model is extended to estimate the single-event-induced collected charge for multiple transistors for circuits simulation. The proposed improvement in the model includes both parasitic-bipolar and charge-shari
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c53163ae51aef46b74fb372744833e89
https://doi.org/10.1109/tns.2015.2492418
https://doi.org/10.1109/tns.2015.2492418
Autor:
Joe W. McPherson, Charles Slayman
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
All materials and devices tend to degrade with time. For this reason, reliability physics is of great theoretical and practical importance. Reliability investigations generally start with measuring the degradation rate for a material/device under str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58813e36574371410e1a1c14260b8e98
https://doi.org/10.1109/irps.2016.7574500
https://doi.org/10.1109/irps.2016.7574500
Autor:
T. Wu, Jeffrey D. Wilkinson, Brett M. Clark, M.S. Gordon, Rick Wong, J. Marckmann, Brendan D. McNally, Yi He, Charles Slayman
Publikováno v:
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
A follow-up alpha emissivity study was conducted to examine the wide variability observed in previous work that was hypothesized to be due to differences in the pulse height discrimination threshold among participant's equipment. Two samples, one mix
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::df6a2960106afe2ed142247821d6f7bf
https://doi.org/10.1109/radecs.2013.6937355
https://doi.org/10.1109/radecs.2013.6937355
Autor:
Brendan D. McNally, Brett M. Clark, Jeffrey D. Wilkinson, Olivier Lauzeral, Jennifer Marckmann, Michael Tucker, Richard Wong, Yi He, Philippe Roche, Charles Slayman, Barry Carroll, Michael S. Gordon, Tommy Wu, Keith Lepla
Publikováno v:
2011 International Reliability Physics Symposium.
Alpha counting measurement methods have been widely used in the semiconductor industry for many years to assess the suitability of materials for semiconductor production and packaging applications. Although a number of published articles describe asp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4d63120188a7a7ab7c8cb76e109f167
https://doi.org/10.1109/irps.2011.5784521
https://doi.org/10.1109/irps.2011.5784521
Autor:
Charles Slayman
Publikováno v:
2011 Proceedings - Annual Reliability and Maintainability Symposium.
As CMOS process technology scales below 100nm, the amount of charge required to upset a gate or memory cell (Q crit ) is decreasing. Therefore, the probability that an energetic particle can generate enough charge to upset a circuit is increasing. Si
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::865a5cc38a8dab917decff284f1c8fee
https://doi.org/10.1109/rams.2011.5754515
https://doi.org/10.1109/rams.2011.5754515
Autor:
Charles Slayman
Publikováno v:
2010 IEEE International Integrated Reliability Workshop Final Report.
Soft errors from alpha particles and terrestrial neutrons have been an issue in commercial electronic systems for over three decades. Measurement and mitigation techniques are well developed, but recent work highlights new issues that will need to be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f72e994d486d69af0c0fdea7c3ebce41
https://doi.org/10.1109/iirw.2010.5706479
https://doi.org/10.1109/iirw.2010.5706479
Autor:
Charles Slayman
Publikováno v:
Soft Errors in Modern Electronic Systems ISBN: 9781441969927
While the history of soft errors in commercial semiconductor devices spans over three decades, it has only been relatively recently that specifications have been created to standardize the characterization of the effects of alpha particles and neutro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4de7cf9157f811eee9805902c5d28f1
https://doi.org/10.1007/978-1-4419-6993-4_3
https://doi.org/10.1007/978-1-4419-6993-4_3
