Zobrazeno 1 - 10
of 55
pro vyhledávání: '"Charles E. Bouldin"'
Autor:
S Selbrede, James R. Ehrstein, V Venturo, Ragesh Puthenkovilakam, Igor Levin, Nhan V. Nguyen, Piero Pianetta, Jane P. Chang, Wilfried Vandervorst, Y S. Lin, Ying Sun, Charles E. Bouldin, Thierry Conard
Publikováno v:
Journal of Applied Physics. 93:5945-5952
The interface of zirconium oxide thin films on silicon is analyzed in detail for their potential applications in the microelectronics. The formation of an interfacial layer of ZrSixOy with graded Zr concentration is observed by the x-ray photoelectro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4057a1d5a293d680ff260792bca1c931
https://doi.org/10.1063/1.1563844
https://doi.org/10.1063/1.1563844
Publikováno v:
X-Ray Spectrometry. 30:431-434
Modeling x-ray absorption near edge structure (XANES) requires computationally intensive calculations. We show that parallel processing can reduce the time required for XANES calculations by a factor of up to 50 over standard desktop computers. Paral
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fcd38574065c7ea23716b99f87a83a0e
https://doi.org/10.1002/xrs.524
https://doi.org/10.1002/xrs.524
Thermal expansion coefficients of low-k dielectric films from Fourier analysis of x-ray reflectivity
Publikováno v:
Journal of Applied Physics. 88:691-695
We determine the thermal expansion coefficient of a fluorinated poly(arylene ether) low-k dielectric film using Fourier analysis of x-ray reflectivity data. The approach is similar to that used in Fourier analysis of x-ray absorption fine structure.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d9f87df3374262c36e221dce2543630
https://doi.org/10.1063/1.373722
https://doi.org/10.1063/1.373722
Publikováno v:
Physical Review B. 60:778-785
When two or more absorption edges in a material are sufficiently close in energy, extended-x-ray-absorption-fine-structure spectroscopy is of limited utility as the usable data range above the lower-energy edge is truncated by the higher-energy edge.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aeba0d2dff4e22db8285362c082a61ed
https://doi.org/10.1103/physrevb.60.778
https://doi.org/10.1103/physrevb.60.778
Publikováno v:
Synchrotron Radiation News. 12:30-33
(1999). Separating overlapping x-ray-absorption edges using diffraction anomalous fine-structure. Synchrotron Radiation News: Vol. 12, No. 3, pp. 30-33.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8866e646255d44d418514dccee23007
https://doi.org/10.1080/08940889908260999
https://doi.org/10.1080/08940889908260999
Autor:
M. I. Bell, G. H. Lander, G. M. Watson, John J. Rehr, Larry B. Sorensen, Thomas Gouder, Matthew Newville, Charles E. Bouldin, Julie O. Cross
Publikováno v:
Physical Review B. 58:11215-11225
Improved calculations of Bragg peak intensities near atomic resonance are obtained by including the effect of the local environment around the resonant atoms on the resonant scattering amplitudes $\ensuremath{\Delta}{f=f}^{\ensuremath{'}}{+if}^{\ensu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be1829143dbd9b5a4b571f627280bfdb
https://doi.org/10.1103/physrevb.58.11215
https://doi.org/10.1103/physrevb.58.11215
Autor:
Bruce Steiner, S. G. Bompadre, Larry B. Sorensen, K. E. Miyano, Johnny P. Kirkland, Bruce Ravel, Joseph G. Pellegrino, Joseph C. Woicik, Charles E. Bouldin, Julie O. Cross
Publikováno v:
Physical Review B. 58:R4215-R4218
Diffraction anomalous fine-structure measurements performed at both the Ga and As {ital K} edges have determined the Ga-As bond length to be 2.442{plus_minus}0.005thinsp{Angstrom} in a buried, 213-{Angstrom}-thick Ga{sub 0.785}In{sub 0.215}As layer g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2452c0338811be56059c667515cb845f
https://doi.org/10.1103/physrevb.58.r4215
https://doi.org/10.1103/physrevb.58.r4215
Publikováno v:
Physical Review B. 55:15386-15389
The local structure within the unit cell of strained-GeSi layers grown on Si(001) has been examined by polarization-dependent extended x-ray-absorption fine structure. First-neighbor bond lengths are found to deviate only slightly from their unstrain
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64ee11a4bdf0fe7e4391ad16be7ccda5
https://doi.org/10.1103/physrevb.55.15386
https://doi.org/10.1103/physrevb.55.15386
Autor:
Sara A. Majetich, Charles E. Bouldin, A. C. Carter, Joseph C. Woicik, M. I. Bell, K. M. Kemner
Publikováno v:
Physical Review B. 55:13822-13828
Extended x-ray-absorption fine structure ~EXAFS!, Fourier-transform infrared absorption ~FTIR!, and elemental analysis were used on a variety of CdSe nanocrystallites ~NC’s ! to study surface structure. All CdSe NC’s were grown by standard invers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a6b5bfdff18b61c8aecab6e8abdfe7c
https://doi.org/10.1103/physrevb.55.13822
https://doi.org/10.1103/physrevb.55.13822
Autor:
Matthew Newville, Julie O. Cross, Charles E. Bouldin, J. C. Woicik, Larry B. Sorensen, Hans Stragier
Publikováno v:
Journal de Physique IV Proceedings
Journal de Physique IV Proceedings, EDP Sciences, 1997, 7 (C2), pp.C2-745-C2-747. ⟨10.1051/jp4:1997224⟩
Journal de Physique IV Proceedings, EDP Sciences, 1997, 7 (C2), pp.C2-745-C2-747. ⟨10.1051/jp4:1997224⟩
The separate complex resonant scattering amplitudes for the two inequivalent Cu sites in YBa 2 CU 3 O 7-δ have been determined using diffraction anomalous fine structure (DAFS). The combined amplitudes Δf(Q,E) for eight specular (00l) reflections w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19e6964456d8ea683e0f93dcb5d3dd2b
https://doi.org/10.1051/jp4:1997224
https://doi.org/10.1051/jp4:1997224