Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Charles C.-H. Hsu"'
Publikováno v:
IEEE Access, Vol 7, Pp 6816-6830 (2019)
According to the prior research, a deterministic parallel test pattern generation (TPG) engine was realized and generated the same test pattern set the serial automatic test pattern generation does during acceleration. However, for retaining the dete
Publikováno v:
ITC
As the Register Transfer Level (RTL) designs are more complicated, debugging becomes a major bottleneck in the design process. To make debugging more efficient, failure binning aims at grouping failure traces caused by the same error source together
Autor:
Charles H.-P. Wen, Charles C.-H. Hsu
Publikováno v:
ITC-Asia
Low-power becomes a critical issue for modern VLSI designs. Unified Power Format (UPF) was invented for power management and enables the low-power design flow. In the UPF specification, controlling cells (including isolation cells, level shifter and
Autor:
Ranma H.-C. Chiang, Hsien C.H. Shen, Charles H.-P. Wen, Michael Y.-C. Wang, Charles C.-H. Hsu
Publikováno v:
2017 International Conference on Applied System Innovation (ICASI).
Recently, the rapid prevalence of mobile devices leads to diversified applications of intelligent IoT systems (including connected devices and cloud computing) for services. Better performance and efficiency can be achieved from well planning and uti