Zobrazeno 1 - 10
of 151
pro vyhledávání: '"Chaplanov, A."'
Publikováno v:
Proceedings of the National Academy of Sciences of Belarus, Physical-Technical Series. 66:7-11
The study of surface morphology of a silicon target after laser exposure, the formation and study of nanoparticles, obtained by laser ablation by ultrashort infrared pulses, were conducted. The material was processed using a yttrium aluminum garnet l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::98fe98026f8c1a9d69cb5b202999da9f
https://doi.org/10.29235/1561-8358-2021-66-1-7-11
https://doi.org/10.29235/1561-8358-2021-66-1-7-11
Publikováno v:
Наука и техника, Vol 0, Iss 2, Pp 63-66 (2013)
Methods of transmission electronic microscopy, electron diffraction, energy dispersive X-ray microanalysis have been used for investigations of element composition, regularities in structural and phase transmissions occurring in thin-filmed systems S
Externí odkaz:
https://doaj.org/article/39f2fcd0354c445586441f664e21d479
Publikováno v:
Наука и техника, Vol 0, Iss 5, Pp 13-16 (2012)
The present paper investigates element composition, regularities of structural and phase transformations in Si–Fe–Si and TiN–Ti–Si thin film systems in the process of impulse photon annealing depending on radiation energy density while applyi
Externí odkaz:
https://doaj.org/article/800252b6fe6b4755800fc1a942c440a5
Autor:
A. M. Chaplanov, A. S. Turtsevich, Ya. A. Solovyov, M. I. Markevich, O. E. Sarychev, Ye. N. Shcherbakova, V. A. Solodukha, A. N. Malyshko
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 79:1360-1363
Electron diffraction methods in reflection geometry are used to investigate the distinctive features of phase transformations that occur in a NiV–Pt–Si system during stationary stepped annealing. A platinum film 0.015–0.02 µm thick and then a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::623861e2bf3699353411552682747680
https://doi.org/10.3103/s1062873815110052
https://doi.org/10.3103/s1062873815110052
Autor:
A. M. Chaplanov, E. N. Shcherbakova, A. G. Bakayev, A. I. Gordienko, V. F. Stelmakh, M. I. Markevich, S. V. Adashkevich
Publikováno v:
Polymer materials and technologies. 1:71-75
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f59c011bfedfaf0603fa8d1b513e4c7d
https://doi.org/10.32864/polymmattech-2015-1-1-71-75
https://doi.org/10.32864/polymmattech-2015-1-1-71-75
Publikováno v:
Inorganic Materials. 50:365-368
We have synthesized a novel TiSi2(C49)/Si silicon-technology-based semiconductor structure which possesses both photoelectric and luminescent properties and is potentially attractive for use in optoelectronic couples. According to IR spectroscopy res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54c16eca2097772010c222bbe5c350fb
https://doi.org/10.1134/s0020168514040190
https://doi.org/10.1134/s0020168514040190
Autor:
Chaplanov, A.M *, Shcherbakova, E.N
Publikováno v:
In Microelectronic Engineering 2000 50(1):165-169
Autor:
Chaplanov, A. M., Shcherbakova, E. N.
Publikováno v:
Technical Physics. Oct2000, Vol. 45 Issue 10, p1331. 4p.
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5:996-1000
The elemental composition and features of structural and phase transformations in the Si-Fe-Si thin-film system (50–30–50 nm) upon steady-state annealing are studied as functions of the temperature and treatment time by energy-dispersive microana
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a40933e8ae8418bf9b952a7048d21cc
https://doi.org/10.1134/s1027451011100144
https://doi.org/10.1134/s1027451011100144
Autor:
Chaplanov, A. M., Shcherbakova, E. N.
Publikováno v:
Technical Physics. Oct99, Vol. 44 Issue 10, p1220. 6p.