Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Chao-Yang Ke"'
Publikováno v:
2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3058ebab8d46bca146a4a9c64a6dc30f
https://doi.org/10.1109/vlsi-tsa/vlsi-dat57221.2023.10134426
https://doi.org/10.1109/vlsi-tsa/vlsi-dat57221.2023.10134426
Publikováno v:
2023 IEEE International Reliability Physics Symposium (IRPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07df3155df8aea89716f1085bcd3ad0c
https://doi.org/10.1109/irps48203.2023.10118299
https://doi.org/10.1109/irps48203.2023.10118299
Autor:
Chao-Yang Ke, Ming-Dou Ker
Publikováno v:
IEEE Transactions on Electron Devices. 67:2702-2709
As fast charging being a comprehensive application in universal serial bus (USB) type-C products, the high-power delivery may cause the USB type-C interface in the high risk of surge events. Therefore, a switch realized by high voltage N-type metal o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::837dfc34a1c527d39a08331fc4958b4b
https://doi.org/10.1109/ted.2020.2992383
https://doi.org/10.1109/ted.2020.2992383
Autor:
Chao-Yang Ke, Ming-Dou Ker
Publikováno v:
IRPS
In USB type-C interface, owing to the shrinking space between the pins of connector and the required high-power delivery, the electrical overstress (EOS) events due to some pins shorting to V BUS pin during plugging or unplugging operations had been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b620955e757a6b36105dcc8d4e8b8f8
https://doi.org/10.1109/irps45951.2020.9129160
https://doi.org/10.1109/irps45951.2020.9129160