Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Chanseok Hwang"'
Publikováno v:
IEICE Transactions on Electronics. :110-118
Autor:
Jawad Yousaf, Kwangho Kim, Daehee Lee, Jinsung Youn, Chanseok Hwang, Jaeyoung Shin, Wansoo Nah
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 60:310-321
This paper proposes a novel way for the estimation of the system level electrostatic discharge (ESD) coupling using the frequency-domain measurements. $ABCD$ parameters are calculated from the measured (simulated) $S$ -parameters of the equipment und
Autor:
Daehee Lee, Chanseok Hwang, Wansoo Nah, Jeong Eun Kim, Hosang Lee, Jinsung Youn, Jawad Yousaf
Publikováno v:
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE).
This paper proposes a method to analyze antenna performance degradation due to electromagnetic interference (EMI) between an antenna and a noise source using active scattering $(S)$ parameters. The victim is a printed planar inverted-F antenna (PIFA)
Autor:
Junhee Han, Hosang Lee, Wansoo Nah, S. Mun, Daehee Lee, Jawad Yousaf, Chanseok Hwang, Jinsung Youn
Publikováno v:
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE).
This work presents a method for the fast and efficient characterization of the system level electrostatic discharge (ESD) noise coupling to real portable computer (note-book) motherboard. The coupled noise to the commercial laptop motherboard, in bot
Autor:
Chanseok Hwang, Myeongko Park, Jinsung Youn, Hosang Lee, Wansoo Nah, Jawad Yousaf, Daehee Lee
Publikováno v:
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC).
This study presents an efficient way for the estimation of the induced electrostatic discharge (ESD) noise to mobile device memory modules in circuit simulation environment. The induced noise due to ESD event at the commercial laptop dynamic random-a
Autor:
Daehee Lee, Jaeyoung Shin, Chanseok Hwang, Wansoo Nah, Jawad Yousaf, Hosang Lee, Jinsung Youn
Publikováno v:
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
In this work, a new technique for an efficient, simple and fast equivalent circuit and full wave numerical modeling of the electrostatic discharge (ESD) generator is presented. A novel circuit model of the NoiseKen ESD simulator is proposed based on
Publikováno v:
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI).
This paper proposes an analysis method for electromagnetic field interference between an antenna and adjacent noise sources, using active scattering parameters. Electromagnetic field interference can be analyzed by measurement or simulation of the sc
Autor:
Jinsung Youn, Daehee Lee, Jaeyoung Shin, Wansoo Nah, Jawad Yousaf, Rao Leqian, Chanseok Hwang
Publikováno v:
2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).
In this study, an analysis of the effect of the electrostatic discharge (ESD) gun grounding strap on the generated ESD stress waveform is presented. The reference ESD waveform is measured using the standard calibration setup of the IEC 61000-4-2 stan
Autor:
Yousaf, Jawad, Myeongkoo Park, Hosang Lee, Jinsung Youn, Daehee Lee, Chanseok Hwang, Wansoo Nah
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility; Apr2018, Vol. 60 Issue 4, Part 2, p1078-1086, 9p
Autor:
Sooyoung Ahn, Younghoi Cheon, Jongeun Koo, Bo-Sun Hwang, Jong-bae Lee, Chanseok Hwang, Moon-Hyun Yoo
Publikováno v:
ISQED
With the increase in circuit frequency and supply voltage Scaling, a robust power network design is essential to ensure that the circuits on a chip operate reliably at the guaranteed level of performance. Traditionally the power network analysis has