Zobrazeno 1 - 10
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pro vyhledávání: '"Chandrasekar, Karthik"'
Autor:
Chandrasekar, Karthik
Thesis (Ph.D.)--North Carolina State University.
Includes vita. Includes bibliographical references (p. 219-231).
Includes vita. Includes bibliographical references (p. 219-231).
Autor:
Chandrasekar, Karthik
Thesis (M.S.)--North Carolina State University.
Includes vita. Includes bibliographical references (p. 49-50).
Includes vita. Includes bibliographical references (p. 49-50).
Autor:
Ashkan Hashemi, David Greenhill, Hyo-Soon Kang, Xiaoping Liu, Chandrasekar Karthik, Guang Chen, Changwook Yoon, Wendemagegnehu T. Beyene
Publikováno v:
2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
The study of the optimal data rates of high-speed channels supported by typical high-performance FPGA chips is presented. First, the representative channels are grouped into distinct categories that have drastically dissimilar characteristics. Conseq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::411c487a87860366ddd8893c9d082982
https://doi.org/10.1109/epeps.2018.8534244
https://doi.org/10.1109/epeps.2018.8534244
This book discusses the design and performance analysis of SDRAM controllers that cater to both real-time and best-effort applications, i.e. mixed-time-criticality memory controllers. The authors describe the state of the art, and then focus on an ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2595::ff4754e50b14a326c848f770b695f62f
https://hdl.handle.net/10400.22/9340
https://hdl.handle.net/10400.22/9340
Akademický článek
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Publikováno v:
2014 IEEE International Symposium on Electromagnetic Compatibility (EMC); 2014, p46-51, 6p
Autor:
Chandrasekar, Karthik, Goossens, Sven, Weis, Christian, Koedam, Martijn, Akesson, Benny, Wehn, Norbert, Goossens, Kees
Publikováno v:
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE); 01/01/2014, p1-6, 6p
Publikováno v:
DAC: Annual ACM/IEEE Design Automation Conference; Jun2013, p1-8, 8p
Publikováno v:
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC); 5/29/2013, p1-8, 8p
Publikováno v:
Proceedings of the Conference: Design, Automation & Test in Europe; 3/18/2013, p236-241, 6p