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pro vyhledávání: '"Chan-Hyeong Park"'
Autor:
Chan Hyeong Park
Publikováno v:
Journal of Applied Physics. 132:214501
The formula for the voltage noise spectrum due to generation–recombination (G–R) rate fluctuations is derived for uniformly doped majority-carrier n-type semiconductor samples with contacts of finite surface recombination velocities. In the deriv
Publikováno v:
JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 19:311-320
Autor:
Chan Hyeong Park
Publikováno v:
Journal of the Institute of Electronics and Information Engineers. 55:13-19
짧은 채널 길이와 긴 채널 너비를 갖는 MOSFET은 너비 방향으로 불균일한 채널 불순물 농도를 갖게 되며, 이에 의해 너비 방향으로 각 지점에서의 MOSFET 채널은 서로 다른 값의 문턱전압을 갖
Publikováno v:
Korean Society for Computer Game. 29:99-106
The genetic algorithm (GA), one of the artificial intelligence (AI), is developed based on Darwin"s theory of evolution, i.e., the mating of randomly selected objects. If more optimal solution is generated, then it is better to repeat the process of
Autor:
In-Young Chung, Chan Hyeong Park
Publikováno v:
JSTS:Journal of Semiconductor Technology and Science. 16:106-111
Thermal noise generated in the electrolyte is modeled for the electrolyte-oxide-semiconductor field-effect transistors. Two noise sources contribute to output noise currents. One is the thermal noise generated in the bulk electrolyte region, and the
Publikováno v:
JSTS:Journal of Semiconductor Technology and Science. 14:153-162
We show that carbon nanotube sensors with gold particles on the single-walled carbon nanotube (SWNT) network operate as Schottky barrier transistors, in which transistor action occurs primarily by varying the resistance of Au-SWNT junction rather tha
Autor:
Jong-Ho Lee, Chan Hyeong Park
Publikováno v:
Solid-State Electronics. 69:85-88
This paper presents the formulas of 1/f noise in Schottky barrier diodes under reverse bias condition. The derived formulas show that the electron density near the metal–semiconductor interface plays an important role in determining the power spect
Autor:
In-Young Chung, Chan Hyeong Park
Publikováno v:
Journal of Applied Physics. 124:164502
The formula for the voltage noise spectrum due to generation-recombination (G-R) rate fluctuations is derived for uniformly doped majority-carrier n-type semiconductor samples. In the derivation of the formula, the ohmic boundary condition is used to
Publikováno v:
IEEE Transactions on Electron Devices. 57:1110-1118
This paper presents a study on 1/f noise in MOSFETs under large-signal (LS) operation, which is important in CMOS analog and RF integrated circuits. The flicker noise is modeled with noise sources as a perturbation in the semiconductor equations empl
Publikováno v:
Microwave and Optical Technology Letters. 51:2570-2573
In this article, we propose a new wideband impedance-transforming three-port power divider using lumped elements. Instead of a π-network used in the conventional lumped Wilkinson power divider, an L-type matching network is employed in the new desig