Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Chae-Ho Kim"'
Publikováno v:
대한환경공학회지, Vol 46, Iss 2, Pp 57-63 (2024)
Objectives Since 2016, TOC (Total Organic Carbon) has replaced COD (Chemical Oxygen Demand) as an organic indicator for effluent wastewater quality standards. However, the distribution of organic substances by process in wastewater treatment faciliti
Externí odkaz:
https://doaj.org/article/312c61e5640e4072bfe73617b9e8f8f1
Autor:
Chae-Ho Kim, Kyung-Sue Shin
Publikováno v:
Journal of Medicine and Life Science. 12:103-106
Central precocious puberty (CPP) is defined as development of secondary sex characteristics in relation with activationof the HPG axis before the age of 8 years in girls and before the age of 9 years in boys. CPP is far less common inchildren before
Autor:
Chae-ho Kim
Publikováno v:
Korea Financial Law Association. 12:123-154
Publikováno v:
International Journal of Modern Physics B. 20:4589-4594
A half-scaled large structural model for an annular structure was built, and its behaviors were tested and obtained by thermal cyclic loads. The model design and test conditions were determined to take into consideration the thermal and mechanical lo
Publikováno v:
Journal of Mechanical Science and Technology. 20:59-65
A half-scaled large test model for the main components of the real annular structure was built and the thermal behaviors were experimented and obtained by thermal cyclic loads. The model design and the test conditions for the thermal loads were deter
Autor:
U-In Chung, Joo-Tae Moon, Hong-suk Kim, Jin-Gyun Kim, Ju-Wan Lim, Sung-Hoi Hur, Yu-gyun Shin, K. Hasebe, Jong-Ho Park, H. Shu, HeeSeok Kim, Chae-Ho Kim, Jae-Young Ahn
Publikováno v:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
For the first time, low-k dielectric ALD-SiBN (atomic layer deposition) is successfully developed and applied on poly-Si/WSix gate as a spacer for reduction of parasitic capacitance between the cells. ALD-SiBN deposition is performed at 630/spl deg/C
Autor:
Jin-Gyun Kim, Jae-Young Ahn, Hong-Suk Kim, Ju-Wan Lim, Chae-Ho Kim, Shu, H., Hasebe, K., Sung-Hoi Hur, Jong-Ho Park, Hee-Seok Kim, Yu-Gyun Shin, U-In Chung, Joo-Tae Moon
Publikováno v:
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p1063-1066, 4p
Publikováno v:
International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics; 10/30/2006, Vol. 20 Issue 25-27, p4589-4594, 6p, 1 Black and White Photograph, 2 Diagrams, 3 Graphs
Conference
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