Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Chad M. Whitney"'
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
A summary of displacement damage sensitivity for bipolar components is presented. For discrete bipolar transistors, sensitivity to DDD correlates with fT. For more complex circuits, a summary of existing test data is presented.
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
We have conducted TID tests on a variety of parts intended for application in different Ball Aerospace space systems. Results and discussion are presented.
Autor:
Whitney, Chad M., Johnson, Erik B., Chen, X. Jie, Stapels, Christopher J., Markosyan, Gary, Van Loef, Edgar, Vogel, Sam, Christian, James F., Thorn, Willard
Publikováno v:
2014 IEEE Aerospace Conference; 2014, p1-9, 9p
Autor:
Whitney, Chad M., Chen, Xiao Jie, Johnson, Erik, Staples, Christopher J., Chapman, Eric, Alberghini, Guy, Rines, Rich, Loef, Edgar V., Glodo, Jarek, Shah, Kanai, Christian, James F.
Publikováno v:
IEEE Transactions on Nuclear Science; 12/1/2011 Part 1 Part 1, Vol. 58 Issue 6, p3095-3102, 8p