Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Ch. Taudt"'
Publikováno v:
Optical Micro- and Nanometrology VII.
In this work, a novel experimental procedure for thin-film characterization and its data analysis is described. The presented technique is based on low-coherence interferometry and resolves thicknesses with nm-precision. An element with known dispers
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ca783ccc811d89fc9c177441d0fd4f91
https://doi.org/10.1117/12.2307166
https://doi.org/10.1117/12.2307166
Autor:
Andreas Greiner, Heiko Assmann, Edmund Koch, Ch. Taudt, Peter Hartmann, Tobias Baselt, Bryan Nelsen
Publikováno v:
Optical Measurement Systems for Industrial Inspection X.
Within this work an alternative approach to precision surface profilometry based on a low-coherence interferometer is presented. Special emphasis is placed on the characterization of edge effects, which influence the measurement result on sharp edges
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b04d9561524f17163486fd56f27c84f0
https://doi.org/10.1117/12.2270318
https://doi.org/10.1117/12.2270318
Publikováno v:
Physics and Simulation of Optoelectronic Devices XXV.
Sensing in harsh environments, such as in high magnetic fields like those found within MRI machines or in high-voltage conditions like those found within power transformers lends itself well for the use of fiber optic sensors. Where conventional elec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e6daf1d833cccf83ba3a67983d8bcfb
https://doi.org/10.1117/12.2252153
https://doi.org/10.1117/12.2252153
Autor:
Heiko Assmann, Bryan Nelsen, Andreas Greiner, Tobias Baselt, Peter Hartmann, Edmund Koch, Ch. Taudt
Manufacturing of precise structures in MEMS, semiconductors, optics and other fields requires high standards in manufacturing and quality control. Appropriate surface topography measurement technologies should therefore deliver nm accuracy in the axi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a4aa73d290171bdb09d613cc5cfefd0
https://tud.qucosa.de/id/qucosa:34883
https://tud.qucosa.de/id/qucosa:34883
Autor:
Bryan Nelsen, Andreas Greiner, Peter Hartmann, H. Aßmann, Ch. Taudt, Tobias Baselt, Edmund Koch
Publikováno v:
Photonic Instrumentation Engineering III.
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilometry. The key component of the interferometer is an element with known dispersion which defines the measurement range as well as the resolution. This
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7c4397687361a262862a42119d8c569a
https://doi.org/10.1117/12.2212913
https://doi.org/10.1117/12.2212913
Autor:
Ch. Taudt, H. Aßmann, Peter Hartmann, Bryan Nelsen, Tobias Baselt, Edmund Koch, Andreas Greiner
Within this work a scan-free, low-coherence interferometry approach for surface profilometry with nm-precision is presented. The basic setup consist of a Michelson-type interferometer which is powered by a super-continuum light-source (Δλ= 400-1700
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d8e5b2c6baca3a3b135f4490a017376
https://tud.qucosa.de/id/qucosa:35105
https://tud.qucosa.de/id/qucosa:35105
Publikováno v:
SPIE Proceedings.
This work analyses samples of the widely used encapsulant of photovoltaics modules, ethylene vinyl acetate (EVA). The samples were cross-linked using a lamination technique for different curing times (0 - 20 minutes). The cross-linking characterizati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06df842f53590fb2f770c02bfcef3077
https://doi.org/10.1117/12.2184814
https://doi.org/10.1117/12.2184814
Autor:
Edmund Koch, Ch. Taudt, Andreas Greiner, Peter Hartmann, A. Augenstein, Heiko Assmann, Tobias Baselt
Publikováno v:
SPIE Proceedings.
In this paper an alternative approach to surface profilometry based on a combined time-spectral domain white-light interferometer is shown. Within the setup a reference interferometer arm contains of a fixed mirror and a material with known dispersio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e26e4dc0f72450277d70d1d2fc2b64eb
https://doi.org/10.1117/12.2179022
https://doi.org/10.1117/12.2179022
Publikováno v:
SPIE Proceedings.
Developments in the field of high-power fiber lasers require extensive knowledge of the fiber structure parameters in various operating states. In an effort to gather such knowledge, this paper presents the results of dispersion characterization meas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0032d92cd63f712ddb1f143e7ff26763
https://doi.org/10.1117/12.2077448
https://doi.org/10.1117/12.2077448
Publikováno v:
SPIE Proceedings.
In recent years the use of supercontinuum light sources has encouraged the development of various optical measurement techniques, like microscopy and optical coherence-tomography. Some disadvantages of common supercontinuum solutions, in particular t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b66e88a02ca6238b284f0dbd3b1ee43e
https://doi.org/10.1117/12.2039245
https://doi.org/10.1117/12.2039245