Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. I. Theoretical concept

Autor: Ch. Genzel, Manuela Klaus, T. Fuss, Matthias Meixner

Publikováno v: Journal of Applied Crystallography. 48:1451-1461

Exploiting the advantages of energy-dispersive synchrotron diffraction, a method for the determination of strongly inhomogeneous residual stress depth gradients is developed, which is an enhancement of the stress scanning technique. For this purpose,

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3b74be9c0f397bebbdde394534dd1ea3
https://doi.org/10.1107/s160057671501448x

Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770 K

Autor: H.-W. Schock, Ch. Genzel, Manuela Klaus, A. Weber, T. Rissom, H. Rodriguez-Alvarez, Roland Mainz, Christian A. Kaufmann

Publikováno v: Journal of Alloys and Compounds. 588:644-647

We use synchrotron-based energy-dispersive X-ray diffraction to study in real-time the phase transformations during the incorporation of thermally evaporated In into a thin Cu film at 770 K. Most of the phase transitions are in agreement with the Cu�

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6ce572d834ebce6e421478e685ea3b3c
https://doi.org/10.1016/j.jallcom.2013.11.147

Residual stress analysis of diamond-coated WC–Co cutting tools: separation of film and substrate information by grazing X-ray diffraction

Autor: Walter Reimers, Matthias Meixner, Ch. Genzel, Manuela Klaus

Publikováno v: Journal of Applied Crystallography. 46:1323-1330

Chemical vapour deposition (CVD) of diamond surface layers is an effective way of improving the properties of cemented carbide cutting tools. Inadequate coating adhesion is one of the main issues and it may be affected by the residual stresses of the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d11f1ed456ce4b81c3fd500ade4e814d
https://doi.org/10.1107/s0021889813020451

Analysis of stress/strain in Electroless Copper Films

Autor: Ch. Genzel, M. Klaus, Tanu Sharma, Tobias Bernhard, Laurence J. Gregoriades, Ralf Brüning, Frank Brüning, Delilah A. Brown, Simon Bamberg

Publikováno v: International Symposium on Microelectronics. 2013:000026-000030

Polymer substrates were chemically coated with copper using various electroless copper baths and the internal strain/stress, as well as the adhesion quality, in the resulting copper films were studied during and after deposition as a function of the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::86f0e9431e3fb517cf5fde81003774b9
https://doi.org/10.4071/isom-2013-ta17

Epitaxial stress and texture in thin oxide layers grown on Fe–Al alloys

Autor: Manuela Klaus, Pedro Paiva Brito, Ch. Genzel, Anke R. Kaysser-Pyzalla, Haroldo Cavalcanti Pinto

Publikováno v: Scopus
Repositório Institucional da UNESP
Universidade Estadual Paulista (UNESP)
instacron:UNESP
Repositório Institucional da USP (Biblioteca Digital da Produção Intelectual)
Universidade de São Paulo (USP)
instacron:USP

Made available in DSpace on 2022-04-28T18:57:19Z (GMT). No. of bitstreams: 0 Previous issue date: 2012-02-01 The development of internal stress and texture in the oxide scales grown on Fe-15 at.% Al (1 0 0) and (1 1 1) single crystals at 700 °C was

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2e654325bdc806d669ff7bdd6997b182
https://doi.org/10.1016/j.actamat.2011.11.033