Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Cesar Javier Lockhart de la Rosa"'
Autor:
Yashwanth Balaji, Quentin Smets, Cesar Javier Lockhart De La Rosa, Anh Khoa Augustin Lu, Daniele Chiappe, Tarun Agarwal, Dennis H. C. Lin, Cedric Huyghebaert, Iuliana Radu, Dan Mocuta, Guido Groeseneken
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 6, Pp 1048-1055 (2018)
2-D transition metal dichalcogenides (TMDs) are promising materials for CMOS application due to their ultrathin channel with excellent electrostatic control. TMDs are especially well suited for tunneling field-effect transistors (TFETs) due to their
Externí odkaz:
https://doaj.org/article/b3e6abfea7bb4f1db4bad4d5dfcd0818
Autor:
Cesar Javier Lockhart de la Rosa, Thomas Nuytten, Luca Banszerus, Stefanie Sergeant, Vivek K. Mootheri, Takashi Taniguchi, Kenji Watanbe, Christoph Stampfer, Cedric Huyghebaert, Stefan De Gendt, Alessandra Leonhardt
Defect characterization of 2D materials is a critical aspect for their successful integration in future electronic devices. Here, a simple characterization technique is proposed that opens a path for fast, non-invasive, quality assessment of transiti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2659::7b68e9e71ad5d03bcafd869e639d1f4c
https://zenodo.org/record/4686975
https://zenodo.org/record/4686975
