Zobrazeno 1 - 10
of 54
pro vyhledávání: '"Cerati, L."'
Publikováno v:
In Microelectronics Reliability November 2022 138
Autor:
Merlo, L., Rossetto, I., Cerati, L., Ghidini, G., Milani, A., Toia, F., Piagge, R., Di Biccari, L., Gevinti, E., Croce, G., Andreini, A.
Publikováno v:
In Microelectronics Reliability September 2019 100-101
Publikováno v:
In Microelectronics Reliability 2003 43(9):1589-1594
Autor:
Sponton, L., Cerati, L., Croce, G., Mura, G., Podda, S., Vanzi, M., Meneghesso, G., Zanoni, E.
Publikováno v:
In Microelectronics Reliability 2002 42(9):1303-1306
Publikováno v:
In Microelectronics Reliability 2001 41(9):1683-1687
Publikováno v:
In Journal of Crystal Growth 2000 214:866-869
Autor:
Gevinti, E., Cerati, L., Sambi, M., Dissegna, M., Cecchetto, L., Andreini, A., Tazzoli, A., Gaudenzio Meneghesso
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a7aab2a23da9e79e71c7e6526b56568c
http://hdl.handle.net/11577/2448881
http://hdl.handle.net/11577/2448881
Autor:
Heer, M., Bychikhin, S., Dubec, V., Pogany, D., Gornik, E., Dissegna, M., Cerati, L., Zullino, L., Andreini, A., Tazzoli, Augusto, Meneghesso, Gaudenzio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3657::883f24a84157c2e79a3730d29b7e8ecb
http://hdl.handle.net/11577/2433285
http://hdl.handle.net/11577/2433285
Publikováno v:
2006 IEEE International Symposium on Power Semiconductor Devices & IC's; 2006, p1-4, 4p
Autor:
Heer, M., Bychikhin, S., Dubec, V., Pogany, D., Gornik, E., Dissegna, M., Cerati, L., Zullino, L., Andreini, A., Tazzoli, A., Meneghesso, G.
Publikováno v:
2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p275-284, 10p