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pro vyhledávání: '"Ceng Kong"'
Publikováno v:
Applied Mechanics and Materials. :1535-1539
In this letter, a high breakdown voltage GaN HEMT device fabricated on semi-insulating self-standing GaN substrate is presented. High quality AlGaN/GaN epilayer was grown on self-standing GaN substrate by metal organic chemical vapor deposition. A 0.
Publikováno v:
2014 IEEE International Conference on Electron Devices and Solid-State Circuits.
High quality thin barrier layer In 0.18 Al 0.82 N/GaN heterostructure was grown by metal-organic chemical vapor deposition (MOCVD). A 0.15 µm gate InAlN/GaN HEMT was fabricated with 1A/mm drain current at zero gate bias. The device show good pinch-o