Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Cedric Mayor"'
Autor:
Kassem Hamze, Philippe Descamps, Cedric Mayor, Daniel Pasquet, Christian Gautier, Dominique Lesenechal
Publikováno v:
2018 22nd International Microwave and Radar Conference (MIKON).
The variation of the linear inductance of a CPW with the frequency is used to extract the effective permeability that depends on the metallic losses. The result allows to separate the dielectric and metallic losses and to calculate some characteristi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::970946932fa95cf57bc2ba2a017d34b7
https://doi.org/10.23919/mikon.2018.8405318
https://doi.org/10.23919/mikon.2018.8405318
Autor:
Bohan Yang, Cocoy Reyes, Cedric Mayor, Dave Singelée, Peter Cockburn, Ingrid Verbauwhede, Yervant Zorian, Vladimir Rozic, Mario Konijnenburg, Erik Jan Marinissen, Robert van Rijsinge, Ping-Hsuan Hsieh, Chih-Tsun Huang, Jeroen Delvaux
Publikováno v:
Proceedings-2016 21st IEEE European Test Symposium, ETS 2016
ETS
ETS
The semiconductor industry has been driving a major part of its growth through first the PC and more recently the mobile market. Unfortunately, the PC market is in decline and also the end of the growth curve for mobile products is in sight now that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85f24a4e7c9b77221b084e3cd321d8dd
https://doi.org/10.1109/ets.2016.7519331
https://doi.org/10.1109/ets.2016.7519331
Autor:
Jean-Pascal Mallet, Cedric Mayor, Suzanne Lesecq, Matthieu Verdy, Emeric de Foucauld, Dominique Morche
Publikováno v:
NEWCAS
Reducing test costs of analog and RF circuits is a complex challenge, for which intuitive solution is to reduce test time. However, such reduction usually leads to a degradation of measurement accuracy not easy to handle when no model is available to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8524c3dccfe1b4fa2a88b595579d4037
https://doi.org/10.1109/newcas.2015.7182104
https://doi.org/10.1109/newcas.2015.7182104
Autor:
Jean-Pascal Mallet, Emeric de Foucauld, Matthieu Verdy, Suzanne Lesecq, Cedric Mayor, Alin Ratiu, Dominique Morche
Publikováno v:
ICECS
In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a67e88962937de74ac0c8fc089988a1
https://doi.org/10.1109/icecs.2014.7049932
https://doi.org/10.1109/icecs.2014.7049932
Publikováno v:
ITC
In this paper we present a Built-In Self-Test (BIST) technique to measure the natural resonance frequency of oscillators which are design to set a much higher than the working speed of most of the current Automated Test Equipment (ATE). Based on an a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::95f9eced561e5bf4e0152ae0a646231c
https://doi.org/10.1109/test.2012.6401588
https://doi.org/10.1109/test.2012.6401588