Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Catriona S.M. Yeoh"'
Autor:
Paul A. Midgley, Rowan K. Leary, Catriona S.M. Yeoh, David Rossouw, Zineb Saghi, Pierre Burdet
Publikováno v:
Microscopy and Microanalysis. 21:759-764
A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acqu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7945d4a25d0486405acde56e3c8bf2e
https://doi.org/10.1017/s1431927615000227
https://doi.org/10.1017/s1431927615000227
Autor:
Paul A. Midgley, Robert Krakow, Pierre Burdet, David Rossouw, Zineb Saghi, Catriona S.M. Yeoh, Rowan K. Leary
Publikováno v:
Microscopy and Microanalysis. 21:2173-2174
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b187308798992f4281eeb8a8beb676e
https://doi.org/10.1017/s1431927615011642
https://doi.org/10.1017/s1431927615011642