Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Cassiano S. N. C. Bueno"'
Autor:
Sergio A. L. Luiz, Cassiano S. N. C. Bueno, Francisco M. C. Silva, Rafael Celestre, Bernd C. Meyer, Regis Oliveira, Alessandra Tomal, Helio C. N. Tolentino, Carlos S. B. Dias
Publikováno v:
Advances in X-Ray/EUV Optics and Components XVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f82732760a30f9603193c822287a96b3
https://doi.org/10.1117/12.2633614
https://doi.org/10.1117/12.2633614
Autor:
Leonardo Mitsuo Kofukuda, Francesco R. Lena, Gabriel B. Z. L. Moreno, Willian H. Wilendorf, Anna P. S. Sotero, Carlos A. Pérez, Antonio C. P. Neto, Douglas Galante, Giovanni L. Baraldi, Cassiano S. N. C. Bueno, Renan Geraldes, Sergio A. L. Luiz, Verônica C. Teixeira, Hélio C. N. Tolentino, Artur Clarindo Pinto, Dean Hesterberg, Carlos S. B. Dias, I.T. Neckel
Publikováno v:
X-Ray Nanoimaging: Instruments and Methods V.
Synchrotron scanning X-ray microscopy has been established as a mature technique, bridging the gap between conventional optical microscopy and high-resolution electron microscopy and, notably, adding advantages like large penetration in bulky samples
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a4d1cc7bc678ba8416c7242dd5bc869
https://doi.org/10.1117/12.2596496
https://doi.org/10.1117/12.2596496