Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Caspar Leendertz"'
Publikováno v:
Solid State Phenomena. 255:331-337
Surface sensitive methods, UV-VIS spectral ellipsometry (SE), surface photovoltage (SPV) measurements, and X-ray photoelectron spectroscopy (XPS) measurements were combined to investigate in detail the Si substrate oxidation and resulting interface e
Autor:
Lars Korte, Uta Stürzebecher, A. Laades, Liz Margarita Montañez, J A Töfflinger, Caspar Leendertz, Bernd Rech, Hans-Peter Sperlich
Publikováno v:
Solar Energy Materials and Solar Cells. 135:49-56
The negative charge formation, the charge-trapping mechanisms and the interface defect passivation of aluminum oxide/silicon nitride (AlO x /SiN x ) stacks deposited by plasma-enhanced chemical vapor deposition on p- type crystalline silicon (c-Si) a
Autor:
Lukáš Görög, Alexander Ulyashin, Juan P. Martínez-Pastor, Nils Petermann, Lars Korte, Said Agouram, J A Töfflinger, Hartmut Wiggers, Raúl García-Calzada, Caspar Leendertz, Vladimir S. Chirvony
Publikováno v:
physica status solidi (a). 212:156-161
The application of layers of doped colloidal silicon nanocrystals sandwiched between hydrogenated amorphous silicon layers as emitters in silicon heterojunction solar cells is explored. It is shown that such emitters provide excellent interface passi
Publikováno v:
physica status solidi (RRL) - Rapid Research Letters. 8:831-835
Excellent passivation of black silicon surfaces by thin amorphous silicon layers deposited with plasma enhanced chemical vapor deposition is demonstrated. Minority charge carrier lifetimes of 1.3 milliseconds, enabling an implied open-circuit voltage
Autor:
Liz Margarita Montañez, Hans-Peter Sperlich, Caspar Leendertz, A. Laades, J A Töfflinger, Lars Korte, Uta Stürzebecher, Bernd Rech
Publikováno v:
Energy Procedia. 55:845-854
The charge dynamics and the interface defect state density of AlOx/SiNx passivation stacks deposited by plasma-enhanced chemical vapor deposition (PECVD) on crystalline silicon (c-Si) wafers are investigated. High frequency (1 MHz) capacitance voltag
Publikováno v:
Energy Procedia. 55:805-812
Subnanometer thin silicon oxide films, applied as interlayer between crystalline silicon absorbers and functional layers, have demonstrated to improve interface passivation properties. Here we compare the interface defect density as well as the fixed
Publikováno v:
Solar Energy Materials and Solar Cells. 117:152-160
A simple and fast 1D effective medium simulation model for polycrystalline silicon thin film solar cells was defined, by using the device simulator AFORS-HET. The model was calibrated with current–voltage measurements of solar cells under illuminat
Autor:
Esteban Pedrueza, J A Töfflinger, Juan P. Martínez-Pastor, Vladimir S. Chirvony, Rafael Abargues, Orman Gref, Raúl García-Calzada, Maurizio Roczen, Bernd Rech, Lars Korte, Caspar Leendertz
Publikováno v:
physica status solidi (a). 210:687-694
Light trapping enhancement by plasmonic-active metal nanoparticles (NPs) is believed to be a promising approach to increase silicon-based solar cell efficiency. Therefore, we investigated TiO2 films in situ doped by Au NPs (TiO2:AuNPs) deposited by s
Publikováno v:
Energy Procedia. 38:677-683
In this study, different designs of contact schemes for back contact silicon heterojunction (BC-SHJ) solar cells are simulated and optimized using numerical device simulation in 2D and 3D for both stripe and point contacts. Unlike in conventional BC
Autor:
Caspar Leendertz, A. Laades, Florian Ruske, Bernd Rech, Thomas Barthel, Enno Malguth, Lars Korte, Maurizio Roczen, Jose Ordeñez, J A Töfflinger, Martin Schade, Hartmut S. Leipner
Publikováno v:
physica status solidi (a). 210:676-681
The structural properties of crystalline Si nanodots embedded in a SiO2 matrix are investigated with respect to the exploitation of quantum confinement effects (QCE) in Si solar cells. The nanostructures are grown on crystalline Si (c-Si) wafers by d