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pro vyhledávání: '"Caroline M. Fedele"'
Autor:
Alyson D. Topper, Melanie D. Berg, Jonathan A. Pellish, Jean-Marie Lauenstein, James Forney, Edward P. Wilcox, Jason M. Osheroff, Peter J. Majewicz, Anthony M. Phan, Hak Kim, Edward J. Wyrwas, Caroline M. Fedele, Megan C. Casey, Max F. Chaiken, Thomas A. Carstens, Martha V. O'Bryan, Michael J. Campola, Donna J. Cochran
Publikováno v:
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC).
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::38d74e8e90356b20a9fdd8518e0cdb3b
https://doi.org/10.1109/redw51883.2020.9325841
https://doi.org/10.1109/redw51883.2020.9325841
