Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Carolina Rendon Barraza"'
Autor:
Guanghui Yuan, Tongjun Liu, Sergei Kurdumov, Eng Aik Chan, Kevin F. MacDonald, Carolina Rendon Barraza, Tanchao Pu, Jun-Yu Ou, Nikolay I. Zheludev, Nikitas Papasimakis
Publikováno v:
Metamaterials, Metadevices, and Metasystems 2021.
We report on recent advances in applications of deep learning and topologically structured light to far-field non-destructive imaging with deep subwalength resolution and picometric metrology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e33600de79d300e8813c527db68c8aa8
https://doi.org/10.1117/12.2595070
https://doi.org/10.1117/12.2595070
Autor:
Guanghui Yuan, Carolina Rendon-Barraza, Giorgio Adamo, Tanchao Pu, Nikolay I. Zheludev, Eng Aik Chan
Publikováno v:
Conference on Lasers and Electro-Optics.
We experimentally demonstrate that a linear dimension of a sub-wavelength nanoscale object can be measured with an accuracy better that λ/250 by a deep-learning-enabled examination of its diffraction pattern.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::495ff4f57a9341c33abc5aa81425c627
https://doi.org/10.1364/cleo_at.2021.jw1a.65
https://doi.org/10.1364/cleo_at.2021.jw1a.65
Autor:
Nikolay I. Zheludev, Carolina Rendon-Barraza, Tanchao Pu, Giorgio Adamo, Guanghui Yuan, Eng Aik Chan
Publikováno v:
APL Photonics, Vol 6, Iss 6, Pp 066107-066107-5 (2021)
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light λ. Metrology of sub-wavelength objects, however, was deemed impossible due to the diff
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::871264d7880c0bd3c882922c0e7c90f0
https://doaj.org/article/3ea6735b5641422ebea3509d0ebae418
https://doaj.org/article/3ea6735b5641422ebea3509d0ebae418